Tony Ambler

According to our database, Tony Ambler authored at least 13 papers between 1994 and 2006.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2006

An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint.

Geewhun Seok, Il-soo Lee, Tony Ambler, Baxter F. Womack

Proceedings of the 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 2006

2005

An Economic Selecting Model for DFT Strategies.

Yu-Ting Lin, Tony Ambler

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

A knowledge-based dispatching model for field service.

Yu-Ting Lin, Tony Ambler

Proceedings of the IEEE International Conference on Systems, 2005

Cost-effective designs of field service for electronic systems.

Yu-Ting Lin, David Williams, Tony Ambler

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Two efficient methods to reduce power and testing time.

Il-soo Lee, Tony Ambler

Proceedings of the 2005 International Symposium on Low Power Electronics and Design, 2005

2004

The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time.

Il-soo Lee, Yong Min Hur, Tony Ambler

Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004

2001

Economics of Built-in Self-Test.

Louis Y. Ungar, Tony Ambler

IEEE Des. Test Comput., 2001

Test Trade-Offs Take Center Stage at ITC.

Tony Ambler, Donald L. Wheater

IEEE Des. Test Comput., 2001

Test Strategies and Marriage Partners.

Tony Ambler

IEEE Des. Test Comput., 2001

Robust transition density estimation by considering input/output transition behavior.

Dongho Kim, Tony Ambler

Proceedings of the 2001 International Symposium on Circuits and Systems, 2001

1999

Guest Editors' Introduction: Test and the Product Life Cycle.

Tony Ambler, Ben Bennetts

IEEE Des. Test Comput., 1999

1997

Design and Test Economics-An Extra Dimension.

Tony Ambler, Magdy S. Abadir

IEEE Des. Test Comput., 1997

1994

Introduction.

Magdy S. Abadir, Tony Ambler

J. Electron. Test., 1994