Guangxi Hu

Affiliations:
  • Fudan University, Shanghai, China


According to our database1, Guangxi Hu authored at least 12 papers between 2011 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2023
Knowledge-based neural network SPICE modeling for MOSFETs and its application on 2D material field-effect transistors.
Sci. China Inf. Sci., February, 2023

2022
Hand Gesture Recognition Using IR-UWB Radar with Spiking Neural Networks.
Proceedings of the 4th IEEE International Conference on Artificial Intelligence Circuits and Systems, 2022

2019
A GaSb/In0.4Ga0.6As Heterojunction Z-Shaped Tunnel Field-Effect Transistor with High Performance.
Proceedings of the 13th IEEE International Conference on ASIC, 2019

2017
Analytical models for channel potential and drain current in AlGaN/GaN HEMT devices.
Proceedings of the 12th IEEE International Conference on ASIC, 2017

2016
Analytical models for channel potential, threshold voltage, and subthreshold swing of junctionless triple-gate FinFETs.
Microelectron. J., 2016

2015
Analytical models for threshold voltage, drain induced barrier lowering effect of junctionless triple-gate FinFETs.
Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015

2013
Analytic models for electric potential and subthreshold swing of the dual-material double-gate MOSFET.
Proceedings of the IEEE 10th International Conference on ASIC, 2013

2012
Quantum mechanical effects on the threshold voltage of surrounding-gate MOSFETs.
Microelectron. J., 2012

2011
Electric potential and threshold voltage models for double-gate Schottky-barrier source/drain MOSFETs.
Microelectron. J., 2011

An analytic model for channel potential and subthreshold swing of the symmetric and asymmetric double-gate MOSFETs.
Microelectron. J., 2011

Quantum mechanical effects on the threshold voltage of the evenly doped surrounding-gate MOSFETs.
Proceedings of the 2011 IEEE 9th International Conference on ASIC, 2011

Effects of unintended dopants on I-V characteristics of the double-gate MOSFETs, a simulation study.
Proceedings of the 2011 IEEE 9th International Conference on ASIC, 2011


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