Gunnar Carlsson

Benjamin Filippenko

CoRR, 2020

2019

Persistent homology of the sum metric.

[BibT_eX]

[DOI]

Benjamin Filippenko

CoRR, 2019

2017

Two Countermeasures Against Hardware Trojans Exploiting Non-Zero Aliasing Probability of BIST.

[BibT_eX]

[DOI]

J. Signal Process. Syst., 2017

2015

Remotely Managed Logic Built-In Self-Test for Secure M2M Communications.

[BibT_eX]

[DOI]

IACR Cryptol. ePrint Arch., 2015

Logic BIST: State-of-the-Art and Open Problems.

[BibT_eX]

[DOI]

CoRR, 2015

A scan partitioning algorithm for reducing capture power of delay-fault LBIST.

[BibT_eX]

[DOI]

Nan Li

Elena Dubrova

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015

2014

Classification of hepatic lesions using the matching metric.

[BibT_eX]

[DOI]

Aaron Adcock

Daniel L. Rubin

Comput. Vis. Image Underst., 2014

Topological pattern recognition for point cloud data.

[BibT_eX]

[DOI]

Acta Numer., 2014

Evaluation of alternative LBIST flows: A case study.

[BibT_eX]

[DOI]

Nan Li

Elena Dubrova

Proceedings of the 2014 NORCHIP, Tampere, Finland, October 27-28, 2014, 2014

Robustness of TAP-based scan networks.

[BibT_eX]

[DOI]

Proceedings of the 2014 International Test Conference, 2014

Keyed logic BIST for Trojan detection in SoC.

[BibT_eX]

[DOI]

Proceedings of the 2014 International Symposium on System-on-Chip, 2014

Fault injection and fault handling: An MPSoC demonstrator using IEEE P1687.

[BibT_eX]

[DOI]

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

2013

Dimension Independent Matrix Square using MapReduce

[BibT_eX]

[DOI]

Reza Bosagh Zadeh

CoRR, 2013

2012

Access Time Analysis for IEEE P1687.

[BibT_eX]

[DOI]

IEEE Trans. Computers, 2012

Reusing and Retargeting On-Chip Instrument Access Procedures in IEEE P1687.

[BibT_eX]

[DOI]

IEEE Des. Test Comput., 2012

Characterizing Properties for Q-Clustering

[BibT_eX]

[DOI]

Reza Bosagh Zadeh

CoRR, 2012

2011

Computational topology for configuration spaces of hard disks

[BibT_eX]

[DOI]

CoRR, 2011

Design automation for IEEE P1687.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation and Test in Europe, 2011

Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints.

[BibT_eX]

[DOI]

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

Test Time Analysis for IEEE P1687.

[BibT_eX]

[DOI]

Proceedings of the 19th IEEE Asian Test Symposium, 2010

Efficient Embedding of Deterministic Test Data.

[BibT_eX]

[DOI]

Proceedings of the 19th IEEE Asian Test Symposium, 2010

2009

Topological De-Noising: Strengthening the Topological Signal.

[BibT_eX]

[DOI]

Jennifer Kloke

CoRR, 2009

2007

Protocol requirements in an SJTAG/IJTAG environment.

[BibT_eX]

[DOI]

Johan Holmqvist

Proceedings of the 2007 IEEE International Test Conference, 2007

2005

How are we going to test SoCs on a board?: the users viewpoint.

[BibT_eX]

[DOI]

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Remote boundary-scan system test control for the ATCA standard.

[BibT_eX]

[DOI]

David Bäckström

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2001

The Design and Optimization of SOC Test Solutions.

[BibT_eX]

[DOI]

Zebo Peng

Proceedings of the 2001 IEEE/ACM International Conference on Computer-Aided Design, 2001

Admission control, power control and QoS analyses for ad hoc wireless networks.

[BibT_eX]

[DOI]

Mung Chiang

Proceedings of the IEEE International Conference on Communications, 2001

LORA: robust and simple routing algorithms for ad hoc mobile wireless networks.

[BibT_eX]

[DOI]

Mung Chiang

Proceedings of the Global Telecommunications Conference, 2001

1993

Test Synthesis from a User Perspective.

[BibT_eX]