Guo-Quan Lu

Orcid: 0000-0003-3079-8589

According to our database1, Guo-Quan Lu authored at least 14 papers between 2001 and 2023.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Awards

IEEE Fellow

IEEE Fellow 2018, "For development of materials and packaging technologies for power electronics modules".

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
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Links

On csauthors.net:

Bibliography

2023
Low Parasitic-Inductance Packaging of a 650 V/150 A Half-Bridge Module Using Enhancement-Mode Gallium-Nitride High Electron Mobility Transistors.
IEEE Trans. Ind. Electron., 2023

2021
Two-Dimensional Mapping of Interface Thermal Resistance by Transient Thermal Measurement.
IEEE Trans. Ind. Electron., 2021

2017
Over-Molded Inductor (OMI) - Feasibility Demonstration in a DC-DC Converter.
IEEE Trans. Ind. Electron., 2017

2016
Thermal characterization of planar high temperature power module packages with sintered nanosilver interconnection.
Microelectron. Reliab., 2016

2015
Thermal characterization system for transient thermal impedance measurement and power cycling of IGBT modules.
Microelectron. Reliab., 2015

Study on high temperature bonding reliability of sintered nano-silver joint on bare copper plate.
Microelectron. Reliab., 2015

Degradation of high power single emitter laser modules using nanosilver paste in continuous pulse conditions.
Microelectron. Reliab., 2015

2013
High temperature ratcheting behavior of nano-silver paste sintered lap shear joint under cyclic shear force.
Microelectron. Reliab., 2013

Ratcheting behavior of sandwiched assembly joined by sintered nanosilver for power electronics packaging.
Microelectron. Reliab., 2013

2005
Effect of substrate flexibility on solder joint reliability. Part II: finite element modeling.
Microelectron. Reliab., 2005

2002
Effect of substrate flexibility on solder joint reliability.
Microelectron. Reliab., 2002

2001
Stacked solder bumping technology for improved solder joint reliability.
Microelectron. Reliab., 2001

Design issues of a three-dimensional packaging scheme for power modules.
Microelectron. Reliab., 2001

Effects of device passivation materials on solderable metallization of IGBTs.
Microelectron. Reliab., 2001


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