H. W. Wan

According to our database1, H. W. Wan authored at least 2 papers in 2019.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of six.

Timeline

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Links

On csauthors.net:

Bibliography

2019
Fundamental Understanding of Oxide Defects in HfO2 and Y2O3 on GaAs(001) with High Thermal Stability.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

BTI Characterization of MBE Si-Capped Ge Gate Stack and Defect Reduction via Forming Gas Annealing.
Proceedings of the IEEE International Reliability Physics Symposium, 2019


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