Helmut Lochner

According to our database, Helmut Lochner authored at least 2 papers between 2012 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2019

Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability.

Alexander Hirler, Adnan Alsioufy, Josef Biba, T. Lehndorff, D. Lipp, Helmut Lochner, Mahesh Siddabathula, S. Simon, Torsten Sulima, Maciej Wiatr, Walter Hansch

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2012

Complexity, quality and robustness - the challenges of tomorrow's automotive electronics.

Ulrich Abelein, Helmut Lochner, Daniel Hahn, Stefan Straube

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012