T. Lehndorff

According to our database, T. Lehndorff authored at least 2 papers between 2017 and 2019.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2019

Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability.

Alexander Hirler, Adnan Alsioufy, Josef Biba, T. Lehndorff, D. Lipp, Helmut Lochner, Mahesh Siddabathula, S. Simon, Torsten Sulima, Maciej Wiatr, Walter Hansch

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2017

Evaluation of effective stress times and stress levels from mission profiles for semiconductor reliability.

A. Hirler, J. Biba, A. Alsioufy, T. Lehndorff, T. Sulima, H. Lochner, U. Abelein, Walter Hansch

Microelectron. Reliab., 2017