Torsten Sulima

According to our database, Torsten Sulima authored at least 2 papers between 2005 and 2019.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2019

Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability.

Alexander Hirler, Adnan Alsioufy, Josef Biba, T. Lehndorff, D. Lipp, Helmut Lochner, Mahesh Siddabathula, S. Simon, Torsten Sulima, Maciej Wiatr, Walter Hansch

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2005

Examination and evaluation of La₂O₃ as gate dielectric for sub-100nm CMOS and DRAM technology.

Vanessa Capodieci, Florian Wiest, Torsten Sulima, Jörg Schulze, Ignaz Eisele

Microelectron. Reliab., 2005