Hirotaka Komoda

According to our database, Hirotaka Komoda authored at least 5 papers between 2004 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2012

Via high resistance failure analysis of LSI devices induced by multiple factors related to process and design.

Takuya Naoe, Hirotaka Komoda, Tamao Ikeuchi, Kohichi Yokoyama

Microelectron. Reliab., 2012

Decapsulation technique using electrochemical etching for failure analysis of WLCSP n-type Si assembled module devices.

Takuya Naoe, Hirotaka Komoda

Microelectron. Reliab., 2012

2007

Sample tilting technique for preventing electrostatic discharge during high-current FIB gas-assisted etching with XeF₂.

Hirotaka Komoda, Chie Moritani, Kazutaka Takahashi, Heiji Watanabe, Kiyoshi Yasutake

Microelectron. Reliab., 2007

2006

Novel charge neutralization techniques applicable to wide current range of FIB processing in FIB-SEM combined system.

Hirotaka Komoda, Masaaki Yoshida, Yoh Yamamoto, Kouji Iwasaki, Ikuko Nakatani, Heiji Watanabe, Kiyoshi Yasutake

Microelectron. Reliab., 2006

2004

An example of fault site localization on a 0.18 mum CMOS device with combination of front and backside techniques.

Yoshiteru Yamada, Hirotaka Komoda

Microelectron. Reliab., 2004