Hyuk Park
Affiliations:- Samsung Electronics, Hwaseong-si, South Korea
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Bibliography
2025
Novel Linear Model for OFF-State Stress Causing Stand-By Current of Advanced VNAND Chip.
Proceedings of the IEEE International Reliability Physics Symposium, 2025
Reliability Characterization Using Accelerated Methods of 1Tb 9th-Gen VNAND for TLC/QLC applications.
Proceedings of the IEEE International Reliability Physics Symposium, 2025