Itai Jaeger

According to our database, Itai Jaeger authored at least 9 papers between 2002 and 2007.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2007

Constraint-Based Random Stimuli Generation for Hardware Verification.

Yehuda Naveh, Michal Rimon, Itai Jaeger, Yoav Katz, Michael Vinov, Eitan Marcus, Gil Shurek

AI Mag., 2007

Intelligent Interleaving of Scenarios: A Novel Approach to System Level Test Generation.

Shady Copty, Itai Jaeger, Yoav Katz, Michael Vinov

Proceedings of the 44th Design Automation Conference, 2007

A Framework for the Validation of Processor Architecture Compliance.

Allon Adir, Sigal Asaf, Laurent Fournier, Itai Jaeger, Ofer Peled

Proceedings of the 44th Design Automation Conference, 2007

2006

Harnessing Machine Learning to Improve the Success Rate of Stimuli Generation.

Shai Fine, Ari Freund, Itai Jaeger, Yishay Mansour, Yehuda Naveh, Avi Ziv

IEEE Trans. Computers, 2006

Addressing Test Generation Challenges for Configurable Processor Verification.

Michal Rimon, Yossi Lichtenstein, Allon Adir, Itai Jaeger, Michael Vinov, S. Johnson, D. Jani

Proceedings of the Eleventh Annual IEEE International High-Level Design Validation and Test Workshop 2006, 2006

2005

Path-Based System Level Stimuli Generation.

Shady Copty, Itai Jaeger, Yoav Katz

Proceedings of the Hardware and Software Verification and Testing, 2005

Reuse in system-level stimuli-generation.

Yoav Katz, Itai Jaeger, Roy Emek, Yossi Lichtenstein, Anita Devadason, Audrey Romonosky

Proceedings of the Tenth IEEE International High-Level Design Validation and Test Workshop 2005, Napa Valley, CA, USA, November 30, 2005

2004

Quality Improvement Methods for System-Level Stimuli Generation.

Roy Emek, Itai Jaeger, Yoav Katz, Yehuda Naveh

Proceedings of the 22nd IEEE International Conference on Computer Design: VLSI in Computers & Processors (ICCD 2004), 2004

2002

X-Gen: a random test-case generator for systems and SoCs.

Roy Emek, Itai Jaeger, Yehuda Naveh, Gadi Bergman, Guy Aloni, Yoav Katz, Monica Farkash, Igor Dozoretz, Alex Goldin

Proceedings of the Seventh IEEE International High-Level Design Validation and Test Workshop 2002, 2002