Ivica Manic

According to our database1, Ivica Manic authored at least 17 papers between 2001 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
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PhD thesis 
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Links

Online presence:

On csauthors.net:

Bibliography

2022
Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress.
J. Circuits Syst. Comput., December, 2022

2018
NBTI and irradiation related degradation mechanisms in power VDMOS transistors.
Microelectron. Reliab., 2018

A review of pulsed NBTI in P-channel power VDMOSFETs.
Microelectron. Reliab., 2018

2015
Microwave Engineering: Concepts and Fundamentals, Ahmad Shahid Khan. CRC Press Taylor & Francis Group, Boca Raton (2014). 800 p., Hardcover, ISBN: 9781466591417.
Microelectron. Reliab., 2015

2011
NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions.
Microelectron. Reliab., 2011

2010
Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress.
Microelectron. Reliab., 2010

2009
Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs.
Microelectron. Reliab., 2009

2008
Negative bias temperature instability in n-channel power VDMOSFETs.
Microelectron. Reliab., 2008

Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs.
IET Circuits Devices Syst., 2008

2007
Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs.
Microelectron. Reliab., 2007

2006
NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs.
Microelectron. Reliab., 2006

2005
Effects of electrical stressing in power VDMOSFETs.
Microelectron. Reliab., 2005

Negative bias temperature instability mechanisms in p-channel power VDMOSFETs.
Microelectron. Reliab., 2005

2003
Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs.
Microelectron. Reliab., 2003

2002
Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs.
Microelectron. Reliab., 2002

Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs.
Microelectron. Reliab., 2002

2001
Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs.
Microelectron. Reliab., 2001


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