Marko S. Andjelkovic

According to our database, Marko S. Andjelkovic authored at least 38 papers between 2015 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Towards Reconfigurable CNN Accelerator for FPGA Implementation.

Rizwan Tariq Syed, Marko S. Andjelkovic, Markus Ulbricht, Milos Krstic

IEEE Trans. Circuits Syst. II Express Briefs, March, 2023

Adaptive Lock-Step System for Resilient Multiprocessing Architectures.

Junchao Chen, Li Lu, Marko S. Andjelkovic, Markus Ulbricht, Milos Krstic

Proceedings of the IEEE Nordic Circuits and Systems Conference, 2023

Towards a Smart Multi-Sensor Ionizing Radiation Monitoring System.

Marko S. Andjelkovic, Junchao Chen, Rizwan Tariq Syed, Fabian Vargas, Markus Ulbricht, Milos Krstic, Stefan D. Ilic, Milos Marjanovic, Sandra Veljkovic, Nikola Mitrovic, Danijel Dankovic, Goran S. Ristic, Russell Duane, Nikola Vasovic, Aleksandar Jaksic, Alberto J. Palma, Antonio M. Lallena, Miguel A. Carvajal

Proceedings of the 26th Euromicro Conference on Digital System Design, 2023

Towards a Comprehensive SET Analysis Flow for VLSI Circuits using Static Timing Analysis.

Christos Georgakidis, Dimitris Valiantzas, Stavros Simoglou, Iordanis Lilitsis, Nikolaos Chatzivangelis, Ilias Golfos, Marko S. Andjelkovic, Christos P. Sotiriou, Milos Krstic

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

A Machine Learning-driven EDAC Method for Space-Application Memory.

Junchao Chen, Marko S. Andjelkovic, Milos Krstic, Fabian Luis Vargas

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

SET and SEU Hardened Clock Gating Cell.

Marko S. Andjelkovic, Oliver Schrape, Anselm Breitenreiter, Milos Krstic

Proceedings of the 38th Conference on Design of Circuits and Integrated Systems, 2023

2022

Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress.

Sandra Veljkovic, Nikola Mitrovic, Vojkan Davidovic, Snezana Golubovic, Snezana Djoric-Veljkovic, Albena Paskaleva, Dencho Spassov, Srboljub Stankovic, Marko S. Andjelkovic, Zoran Prijic, Ivica Manic, Aneta Prijic, Goran S. Ristic, Danijel Dankovic

J. Circuits Syst. Comput., December, 2022

Analysis of Single Event Transient Effects in Standard Delay Cells Based on Decoupling Capacitors.

Marko S. Andjelkovic, Milos Marjanovic, Bojan Drasko, Cristiano Calligaro, Oliver Schrape, Umberto Gatti, Felipe A. Kuentzer, Stefan D. Ilic, Goran S. Ristic, Milos Krstic

J. Circuits Syst. Comput., December, 2022

A design concept for radiation hardened RADFET readout system for space applications.

Marko S. Andjelkovic, Aleksandar Simevski, Junchao Chen, Oliver Schrape, Zoran Stamenkovic, Milos Krstic, Stefan D. Ilic, Goran S. Ristic, Aleksandar Jaksic, Nikola Vasovic, Russell Duane, Alberto J. Palma, Antonio M. Lallena, Miguel A. Carvajal

Microprocess. Microsystems, April, 2022

A methodology for characterization, modeling and mitigation of single event transient effects in CMOS standard combinational cells (Eine Methode zur Charakterisierung, Modellierung und Minderung von SET Effekten in kombinierten CMOS-Standardzellen)

Marko S. Andjelkovic

PhD thesis, 2022

Solar Particle Event and Single Event Upset Prediction from SRAM-Based Monitor and Supervised Machine Learning.

Junchao Chen, Thomas Lange, Marko S. Andjelkovic, Aleksandar Simevski, Lu Li, Milos Krstic

IEEE Trans. Emerg. Top. Comput., 2022

Fast Error Propagation Probability Estimates by Answer Set Programming and Approximate Model Counting.

Anselm Breitenreiter, Marko S. Andjelkovic, Oliver Schrape, Milos Krstic

IEEE Access, 2022

2021

Design and Evaluation of Radiation-Hardened Standard Cell Flip-Flops.

Oliver Schrape, Marko S. Andjelkovic, Anselm Breitenreiter, Steffen Zeidler, Alexey Balashov, Milos Krstic

IEEE Trans. Circuits Syst. I Regul. Pap., 2021

Monitoring of Particle Flux and LET Variations with Pulse Stretching Inverters.

Marko S. Andjelkovic, Junchao Chen, Aleksandar Simevski, Oliver Schrape, Milos Krstic, Rolf Kraemer

CoRR, 2021

Reliability Analysis in Less than 200 Lines of Code.

Anselm Breitenreiter, Oliver Schrape, Marko S. Andjelkovic, Milos Krstic

Proceedings of the 12th IEEE Latin America Symposium on Circuits and System, 2021

A Tunable Single Event Transient Filter Based on Digitally Controlled Capacitive Delay Cells.

Marko S. Andjelkovic, Oliver Schrape, Anselm Breitenreiter, Junchao Chen, Milos Krstic

Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021

2020

Double cell upsets mitigation through triple modular redundancy.

Yuanqing Li, Anselm Breitenreiter, Marko S. Andjelkovic, Junchao Chen, Milan Babic, Milos Krstic

Microelectron. J., 2020

PISA: Power-robust Multiprocessor Design for Space Applications.

Aleksandar Simevski, Oliver Schrape, Carlos Benito, Milos Krstic, Marko S. Andjelkovic

Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020

Characterization of Single Event Transient Effects in Standard Delay Cells.

Marko S. Andjelkovic, Oliver Schrape, Anselm Breitenreiter, Milos Krstic, Rolf Kraemer

Proceedings of the 27th IEEE International Conference on Electronics, Circuits and Systems, 2020

A Review of Particle Detectors for Space-Borne Self-Adaptive Fault-Tolerant Systems.

Marko S. Andjelkovic, Junchao Chen, Aleksandar Simevski, Zoran Stamenkovic, Milos Krstic, Rolf Kraemer

Proceedings of the IEEE East-West Design & Test Symposium, 2020

Design Concept for Radiation-Hardening of Triple Modular Redundancy TSPC Flip-Flops.

Oliver Schrape, Marko S. Andjelkovic, Anselm Breitenreiter, Alexey Balashov, Milos Krstic

Proceedings of the 23rd Euromicro Conference on Digital System Design, 2020

Design of Radiation Hardened RADFET Readout System for Space Applications.

Marko S. Andjelkovic, Aleksandar Simevski, Junchao Chen, Oliver Schrape, Zoran Stamenkovic, Milos Krstic, Stefan D. Ilic, Luka Spahic, Laza Kostic, Goran S. Ristic, Aleksandar Jaksic, Alberto J. Palma, Antonio M. Lallena, Miguel Angel Carvaja

Proceedings of the 23rd Euromicro Conference on Digital System Design, 2020

Hardware Accelerator Design with Supervised Machine Learning for Solar Particle Event Prediction.

Junchao Chen, Thomas Lange, Marko S. Andjelkovic, Aleksandar Simevski, Milos Krstic

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020

2019

Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells.

Marko S. Andjelkovic, Yuanqing Li, Zoran Stamenkovic, Milos Krstic, Rolf Kraemer

Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

A Particle Detector Based on Pulse Stretching Inverter Chain.

Marko S. Andjelkovic, Mitko Veleski, Junchao Chen, Aleksandar Simevski, Milos Krstic, Rolf Kraemer

Proceedings of the 26th IEEE International Conference on Electronics, Circuits and Systems, 2019

Design of SRAM-Based Low-Cost SEU Monitor for Self-Adaptive Multiprocessing Systems.

Junchao Chen, Marko S. Andjelkovic, Aleksandar Simevski, Yuanqing Li, Patryk Skoncej, Milos Krstic

Proceedings of the 22nd Euromicro Conference on Digital System Design, 2019

2018

Study of the operation and SET robustness of a CMOS pulse stretching circuit.

Marko S. Andjelkovic, Milos Krstic, Rolf Kraemer

Microelectron. Reliab., 2018

Use of Decoupling Cells for Mitigation of SET Effects in CMOS Combinational Gates.

Marko S. Andjelkovic, Milan Babic, Yuanqing Li, Oliver Schrape, Milos Krstic, Rolf Kraemer

Proceedings of the 25th IEEE International Conference on Electronics, Circuits and Systems, 2018

Impact of Resistive Open and Bridge Defects on the SET Robustness of Standard CMOS Combinational Logic.

Marko S. Andjelkovic, Zoran Stamenkovic, Milos Krstic, Rolf Kraemer

Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018

D-SET Mitigation Using Common Clock Tree Insertion Techniques for Triple-Clock TMR Flip-Flop.

Oliver Schrape, Anselm Breitenreiter, Marko S. Andjelkovic, Milos Krstic

Proceedings of the 21st Euromicro Conference on Digital System Design, 2018

Flip-Flop SEUs Mitigation through Partial Hardening of Internal Latch and Adjustment of Clock Duty Cycle.

Yuanqing Li, Anselm Breitenreiter, Marko S. Andjelkovic, Oliver Schrape, Milos Krstic

Proceedings of the 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2018

2017

Assessment of the amplitude-duration criterion for SET/SEU robustness evaluation.

Marko S. Andjelkovic, Milos Krstic, Rolf Kraemer

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

Design of an On-chip System for the SET Pulse Width Measurement.

Marko S. Andjelkovic, Vladimir Petrovic, Miljana Nenadovic, Anselm Breitenreiter, Milos Krstic, Rolf Kraemer

Proceedings of the Euromicro Conference on Digital System Design, 2017

An analysis of the operation and SET robustness of a CMOS pulse stretching circuit.

Marko S. Andjelkovic, Milos Krstic, Rolf Kraemer

Proceedings of the 20th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2017

A Critical Charge Model for Estimating the SET and SEU Sensitivity: A Muller C-Element Case Study.

Marko S. Andjelkovic, Milos Krstic, Rolf Kraemer, Varadan Savulimedu Veeravalli, Andreas Steininger

Proceedings of the 26th IEEE Asian Test Symposium, 2017

2016

SET response of a SEL protection switch for 130 and 250 nm CMOS technologies.

Marko S. Andjelkovic, Aleksandar Ilic, Vladimir Petrovic, Miljana Nenadovic, Zoran Stamenkovic, Goran S. Ristic

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

2015

Circuit-Level Simulation of the Single Event Transients in an On-Chip Single Event Latchup Protection Switch.

Marko S. Andjelkovic, Vladimir Petrovic, Zoran Stamenkovic, Goran S. Ristic, Goran S. Jovanovic

J. Electron. Test., 2015

Simulation-Based Analysis of the Single Event Transient Response of a Single Event Latchup Protection Switch.

Marko S. Andjelkovic, Vladimir Petrovic, Zoran Stamenkovic, Goran S. Ristic, Goran S. Jovanovic

Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015