J. Ahn

According to our database, J. Ahn authored at least 5 papers between 2003 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2025

Novel Linear Model for OFF-State Stress Causing Stand-By Current of Advanced VNAND Chip.

H. Park, G.-J. Kim, N.-J. Kim, J. Ahn, T. You, Y. Kang, M. Yoon, S. Lee, N.-H. Lee, S. Hwang, YC Hwang, SB. Ko, S. Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2024

Effect of Off-State Stress on Data-Valid Window Margin for Advanced DRAM Using HK/MG Process Technology.

Sunhang Lee, Nam-Hyun Lee, G.-J. Kim, J. Ahn, Ik-Hwan Kim, S. Ha, S. Rhee, GH Bae, KW Lee, YS Lee, SB. Ko, S. Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2022

Scaling of Memory Performance and Capacity with CXL Memory Expander.

Sung Joo Park, H. Kim, K.-S. Kim, J. So, J. Ahn, W.-J. Lee, D. Kim, Young-Ju Kim, J. Seok, J.-G. Lee, H.-Y. Ryu, C. Y. Lee, J. Prout, K.-C. Ryoo, S.-J. Han, M.-K. Kook, J. S. Choi, J. Gim, Y. S. Ki, S. Ryu, C. Park, D.-G. Lee, J. Cho, H. Song, Jin-Yup Lee

Proceedings of the 2022 IEEE Hot Chips 34 Symposium, 2022

2006

Design of field-plate terminated 4H-SiC Schottky diodes using high-k dielectrics.

Amit Kumta, Rusli, Chin-Che Tin, J. Ahn

Microelectron. Reliab., 2006

2003

A Novel Lumped Two Degrees Of Freedom Pull-In Approach To Electrostatic Torsional Micromirrors.

J.-M. Huang, A. Q. Liu, X. M. Zhang, J. Ahn

Int. J. Comput. Eng. Sci., 2003