Jacques Pinaton

According to our database1, Jacques Pinaton authored at least 37 papers between 2010 and 2019.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2019
Limiting state space explosion of model checking using discrete event simulation: combining DEVS and PROMELA.
Proceedings of the 2019 Summer Simulation Conference, 2019

Evaluation of Alarm System Performance and Management in Semiconductor Manufacturing.
Proceedings of the 6th International Conference on Control, 2019

Indicator of Alarm Risk on Product Degradation, Prediction for Alarms Grouping, Using Alarms Data in Semiconductor Manufacturing.
Proceedings of the 58th IEEE Conference on Decision and Control, 2019

Monitoring of a sampled process data under Run-to-Run control: application to a semiconductor process.
Proceedings of the 15th IEEE International Conference on Automation Science and Engineering, 2019

2018
Virtual Metrology Modeling based on Gaussian Bayesian Network.
Proceedings of the 2018 Winter Simulation Conference, 2018

A Study on the Integration of Complex Machines in Complex Job shop Scheduling.
Proceedings of the 2018 Winter Simulation Conference, 2018

A Bayesian indicator for Run-to-Run Performance Assessment using Industrail Risk.
Proceedings of the 2018 Winter Simulation Conference, 2018

Improving Business Process in semiconductor manufacturing by Discovering Business Rules.
Proceedings of the 2018 Winter Simulation Conference, 2018

A Bayesian indicator for Run-to-Run performance assessment in semiconductor manufacturing.
Proceedings of the 14th Conference on Ph.D. Research in Microelectronics and Electronics, 2018

2017
Translation-Invariant Multiscale Energy-Based PCA for Monitoring Batch Processes in Semiconductor Manufacturing.
IEEE Trans Autom. Sci. Eng., 2017

A Simulation-Based Approach for an Effective AMHS Design in a Legacy Semiconductor Manufacturing Facility.
Proceedings of the 2017 Winter Simulation Conference, 2017

Product quality prediction using alarm data : Application to the semiconductor manufacturing process.
Proceedings of the 25th Mediterranean Conference on Control and Automation, 2017

Analysis of similarities between alarm events in the semiconductor manufacturing process.
Proceedings of the 25th Mediterranean Conference on Control and Automation, 2017

2016
Run-to-Run sensor variation monitoring for process fault diagnosis in semiconductor manufacturing.
Proceedings of the Winter Simulation Conference, WSC 2016, 2016

Self-tuning of dEWMA controller parameters for mixed product processes with equipment aging.
Proceedings of the 24th Mediterranean Conference on Control and Automation, 2016

Gaussian Time Error: A new index for fault detection in semiconductor processes.
Proceedings of the 2016 American Control Conference, 2016

2015
Optimized allocation of defect inspection capacity with a dynamic sampling strategy.
Comput. Oper. Res., 2015

Simulation model to control risk levels on process equipment through metrology in semiconductor manufacturing.
Proceedings of the 2015 Winter Simulation Conference, 2015

Degradation modelling with operating mode changes.
Proceedings of the 2015 IEEE Conference on Prognostics and Health Management, 2015

2014
Similar sample selection approach based on sequence alignment; application to semiconductor industry.
Proceedings of the 22nd Mediterranean Conference on Control and Automation, 2014

A Pattern-based Approach for Semantic Retrieval of Information Resources in Enterprises - Application Within STMicroelectronics.
Proceedings of the ICEIS 2014, 2014

Smart dynamic sampling for wafer at risk reduction in semiconductor manufacturing.
Proceedings of the 2014 IEEE International Conference on Automation Science and Engineering, 2014

2013
Skipping algorithms for defect inspection using a dynamic control strategy in semiconductor manufacturing.
Proceedings of the Winter Simulations Conference: Simulation Making Decisions in a Complex World, 2013

A Semantic Mapping Approach to Retrieve Manufacturing Information Resources: STMicroelectronics' Case Study.
Proceedings of the 7th IFAC Conference on Manufacturing Modelling, Management, and Control, 2013

Application of Principal Components Analysis to improve fault detection and diagnosis on semiconductor manufacturing equipment.
Proceedings of the European Control Conference, 2013

A semantic support to improve the collaborative control of manufacturing processes in industries.
Proceedings of the 2013 IEEE 17th International Conference on Computer Supported Cooperative Work in Design (CSCWD), 2013

2012
A mathematical model for estimating defect inspection capacity with a dynamic control strategy.
Proceedings of the Winter Simulation Conference, 2012

Validating manufacturing processes using timed sequential machines: application to a semiconductor manufacturing process (WIP).
Proceedings of the 2012 Spring Simulation Multiconference, 2012

A survey of semantic web standards to representing knowledge in problem solving situations.
Proceedings of the 2012 International Conference on Information Retrieval & Knowledge Management, 2012

A Topic-Map-based Framework to Enhance Components' Retrieval in a Process Control.
Proceedings of the ICEIS 2012 - Proceedings of the 14th International Conference on Enterprise Information Systems, Volume 2, Wroclaw, Poland, 28 June, 2012

Dispatching of lots to dynamically reduce the wafers at risk in semiconductor manufacturing.
Proceedings of the 2012 IEEE International Conference on Automation Science and Engineering, 2012

2011
A smart sampling scheduling and skipping simulator and its evaluation on real data sets.
Proceedings of the Winter Simulation Conference 2011, 2011

Impact of control plan design on tool risk management: a simulation study in semiconductor manufacturing.
Proceedings of the Winter Simulation Conference 2011, 2011

Constructing DEVS models based on experts' knowledge: application to STMicroelectronics' large scale manufacturing processes.
Proceedings of the 2011 Spring Simulation Multi-conference, 2011

New methodology for modeling large scale manufacturing process: Using process mining methods and experts' knowledge.
Proceedings of the 9th IEEE/ACS International Conference on Computer Systems and Applications, 2011

2010
Discovering Large Scale Manufacturing Process Models from Timed Data - Application to STMicroelectronics' Production Processes.
Proceedings of the ICSOFT 2010, 2010

Modeling Large Scale Manufacturing Process from Timed Data - Using the TOM4L Approach and Sequence Alignment Information for Modeling STMicroelectronics' Production Processes.
Proceedings of the ICEIS 2010 - Proceedings of the 12th International Conference on Enterprise Information Systems, Volume 2, AIDSS, Funchal, Madeira, Portugal, June 8, 2010


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