Michel Combal
According to our database1,
Michel Combal
authored at least 7 papers
between 2017 and 2021.
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Bibliography
2021
From Alarm System Events Towards Quality Inspection of The Final Product: Application to a Semiconductor Industry.
Proceedings of the 2021 European Control Conference, 2021
Data-Based Approach for Final Product Quality Inspection: Application to a Semiconductor Industry.
Proceedings of the 2021 60th IEEE Conference on Decision and Control (CDC), 2021
2019
Quality Prediction in Semiconductor Manufacturing processes Using Multilayer Perceptron Feedforward Artificial Neural Network<sup>*</sup>.
Proceedings of the 8th International Conference on Systems and Control, 2019
Evaluation of Alarm System Performance and Management in Semiconductor Manufacturing.
Proceedings of the 6th International Conference on Control, 2019
Indicator of Alarm Risk on Product Degradation, Prediction for Alarms Grouping, Using Alarms Data in Semiconductor Manufacturing.
Proceedings of the 58th IEEE Conference on Decision and Control, 2019
2017
Product quality prediction using alarm data : Application to the semiconductor manufacturing process.
Proceedings of the 25th Mediterranean Conference on Control and Automation, 2017
Analysis of similarities between alarm events in the semiconductor manufacturing process.
Proceedings of the 25th Mediterranean Conference on Control and Automation, 2017