Jaeduk Lee
Orcid: 0000-0001-8520-8801Timeline
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2023
IEEE Commun. Lett., 2023
Novel Strategies for Highly Uniform and Reliable Cell Characteristics of 8th Generation 1Tb 3D-NAND Flash Memory.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023
High Bit Cost Scalability and Reliable Cell Characteristics for 7th Generation 1Tb 4Bit/Cell 3D-NAND Flash.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023
Process Improvements for 7<sup>th</sup> Generation 1Tb Quad-Level Cell 3D NAND Flash Memory in Mass Production.
Proceedings of the IEEE International Memory Workshop, 2023