Jaeyeop Ahn
According to our database1,
Jaeyeop Ahn
authored at least 2 papers
between 2015 and 2025.
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Bibliography
2025
Reliability Characterization Using Accelerated Methods of 1Tb 9th-Gen VNAND for TLC/QLC applications.
Proceedings of the IEEE International Reliability Physics Symposium, 2025
2015
IEICE Trans. Inf. Syst., 2015