Jaeyeop Ahn

According to our database, Jaeyeop Ahn authored at least 4 papers between 2015 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2025

Novel Linear Model for OFF-State Stress Causing Stand-By Current of Advanced VNAND Chip.

Hyuk Park, Gang-Jun Kim, Nam-Jae Kim, Jaeyeop Ahn, Taehun You, Y. Kang, M. Yoon, Seonhaeng Lee, Nam-Hyun Lee, Sang Won Hwang, Yuchul Hwang, Seungbum Ko, Sangwoo Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2025

Reliability Characterization Using Accelerated Methods of 1Tb 9th-Gen VNAND for TLC/QLC applications.

Gang-Jun Kim, Taehun You, Sewon Jeon, Seung Hwan Kwak, Hwangju Song, Shinhyung Kim, Nam-Jae Kim, Jaeyeop Ahn, Hyuk Park, Seonhaeng Lee, Nam-Hyun Lee, Young Hoon Cho, Sang Won Hwang, Yuchul Hwang, Seungbum Ko, Sangwoo Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2025

2024

Effect of Off-State Stress on Data-Valid Window Margin for Advanced DRAM Using HK/MG Process Technology.

Sunhang Lee, Nam-Hyun Lee, Gang-Jun Kim, Jaeyeop Ahn, Ik-Hwan Kim, S. Ha, S. Rhee, GH Bae, KW Lee, YS Lee, Seungbum Ko, Sangwoo Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2015

Split-Jaccard Distance of Hierarchical Decompositions for Software Architecture.

Ki-Seong Lee, Byung-Woo Hong, Youngmin Kim, Jaeyeop Ahn, Chan-Gun Lee

IEICE Trans. Inf. Syst., 2015