James F. Frenzel

According to our database, James F. Frenzel authored at least 11 papers between 1993 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Personality Assessment from Text for Machine Commonsense Reasoning.

Niloofar Hezarjaribi, Zhila Esna Ashari, James F. Frenzel, Hassan Ghasemzadeh, Saied Hemati

CoRR, 2020

2006

Bioinformatic searches using a single-chip shared-memory multiprocessor.

Scott F. Smith, James F. Frenzel

Future Gener. Comput. Syst., 2006

2003

Bioinformatics Application of a Scalable Supercomputer-On-Chip Architecture.

Scott F. Smith, James F. Frenzel

Proceedings of the International Conference on Parallel and Distributed Processing Techniques and Applications, 2003

2000

Special Purpose Image Convolution with Evolvable Hardware.

Joe Dumoulin, James A. Foster, James F. Frenzel, Steve McGrew

Proceedings of the Real-World Applications of Evolutionary Computing, 2000

Size versus Robustness in Evolved Sorting Networks: Is Bigger Better?

Jason Masner, John Cavalieri, James F. Frenzel, James A. Foster

Proceedings of the 2nd NASA / DoD Workshop on Evolvable Hardware (EH 2000), 2000

1999

Representation and Robustness for Evolved Sorting Networks.

Jason Masner, John Cavalieri, James F. Frenzel, James A. Foster

Proceedings of the 1st NASA / DoD Workshop on Evolvable Hardware (EH '99), 1999

1997

An industrial-strength design flow in just fifteen easy weeks!

James F. Frenzel

Proceedings of the 1997 IEEE International Conference on Microelectronic Systems Education, 1997

1996

Behavior of a radiation-immune CMOS logic family under resistive shorts.

Erik H. Ingermann, James F. Frenzel

IEEE Trans. Reliab., 1996

1993

Training Product Unit Neural Networks with Genetic Algorithms.

David J. Janson, James F. Frenzel

IEEE Expert, 1993

Defect-tolerant cache memory design.

Dan Lamet, James F. Frenzel

Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993

Sensitivity analysis of a radiation immune CMOS logic family under defect conditions.

Erik H. Ingermann, James F. Frenzel

Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993