James J. Grealish

According to our database, James J. Grealish authored at least 3 papers between 2006 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2012

Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox.

Zoe Conroy, James J. Grealish, Harrison Miles, Anthony J. Suto, Alfred L. Crouch, Skip Meyers

Proceedings of the 2012 IEEE International Test Conference, 2012

2008

Solving In-Circuit Defect Coverage Holes with a Novel Boundary Scan Application.

Dave F. Dubberke, James J. Grealish, Bill Van Dick

Proceedings of the 2008 IEEE International Test Conference, 2008

2006

Implementation of Solder-bead Probing in High Volume Manufacturing.

Madhavan Doraiswamy, James J. Grealish

Proceedings of the 2006 IEEE International Test Conference, 2006