Jason P. Hurst

According to our database1, Jason P. Hurst authored at least 3 papers between 1994 and 1997.

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Bibliography

1997
A differential built-in current sensor design for high-speed IDDQ testing.
IEEE J. Solid State Circuits, 1997

1995
Flip-flop sharing in standard scan path to enhance delay fault testing of sequential circuits.
Proceedings of the 4th Asian Test Symposium (ATS '95), 1995

1994
Incorporating IDDQ testing in BIST: improved coverage through test diversity.
Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994


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