Jay S. Burnham

According to our database, Jay S. Burnham authored at least 2 papers between 1999 and 2005.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2005

Negative bias temperature instability on three oxide thicknesses (1.4/2.2/5.2 nm) with nitridation variations and deuteration.

Terence B. Hook, Ronald J. Bolam, William Clark, Jay S. Burnham, Nivo Rovedo, Laura Schutz

Microelectron. Reliab., 2005

1999

Nitrided gate oxides for 3.3-V logic application: Reliability and device design considerations.

Terence B. Hook, Jay S. Burnham, Ronald J. Bolam

IBM J. Res. Dev., 1999