Jeongha Park

According to our database, Jeongha Park authored at least 10 papers between 2010 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2025

Multi-Level Graph Representation Learning Through Predictive Community-based Partitioning.

Bo-Young Lim, Jeongha Park, Kisung Lee, Hyuk-Yoon Kwon

Proc. ACM Manag. Data, February, 2025

16.4: SambaNova SN40L: A 5nm 2.5D Dataflow Accelerator with Three Memory Tiers for Trillion Parameter AI.

Raghu Prabhakar, Junwei Zhou, Darshan Gandhi, Youngmoon Choi, Mahmood Khayatzadeh, Kyunglok Kim, Uma Durairajan, Jeongha Park, Satyajit Sarkar, Jinuk Luke Shin

Proceedings of the IEEE International Solid-State Circuits Conference, 2025

2024

SaaN 2L-GRL: Two-Level Graph Representation Learning Empowered With Subgraph-as-a-Node.

Jeongha Park, Bo-Young Lim, Kisung Lee, Hyuk-Yoon Kwon

IEEE Trans. Knowl. Data Eng., December, 2024

Learning With Correlation-Guided Attention for Multienergy Consumption Forecasting.

Jong Seong Park, Jeongha Park, Jihyeok Choi, Hyuk-Yoon Kwon

IEEE Trans. Ind. Informatics, November, 2024

An Effective Algorithm of Outlier Correction in Space-Time Radar Rainfall Data Based on the Iterative Localized Analysis.

Yongchan Kim, Dongkyun Kim, Jeongha Park, Changhyun Jun

IEEE Trans. Geosci. Remote. Sens., 2024

2023

Two-Level Graph Representation Learning with Community-as-a-Node Graphs.

Jeongha Park, Kisung Lee, Hyuk-Yoon Kwon

Proceedings of the IEEE International Conference on Data Mining, 2023

2022

Cyberattack detection model using community detection and text analysis on social media.

Jeongha Park, Hyuk-Yoon Kwon

ICT Express, 2022

2021

Factors Influencing the Accuracy of Shallow Snow Depth Measured Using UAV-Based Photogrammetry.

Sangku Lee, Jeongha Park, Eunsoo Choi, Dongkyun Kim

Remote. Sens., 2021

2013

Impact of III-V and Ge Devices on Circuit Performance.

Jeongha Park, Saeroonter Oh, Soyoung Kim, H.-S. Philip Wong, S. Simon Wong

IEEE Trans. Very Large Scale Integr. Syst., 2013

2010

Modeling and analysis of III-V logic FETs for devices and circuits: Sub-22nm technology III-V SRAM cell design.

Saeroonter Oh, Jeongha Park, S. Simon Wong, H.-S. Philip Wong

Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010