We stand with Ukraine

We stand with Ukraine

Jie Xiao

Orcid: 0000-0001-6004-218X

Affiliations:

Zhejiang University of Technology, Hangzhou, China

According to our database¹, Jie Xiao authored at least 39 papers between 2016 and 2026.

Collaborative distances:

Dijkstra number² of four.
Erdős number³ of four.

Timeline

Legend:

Book In proceedings Article PhD thesis Dataset Other

Links

Online presence:

on orcid.org
on ieeexplore.ieee.org

On csauthors.net:

Bibliography

2026

Probabilistic Injection-Based Reliability Evaluation for Correlated Input Vectors in Sequential Circuits.

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IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., February, 2026

ReEPM: A Reliability Estimation Framework for CNNs based on Error Probability Matrix modeling.

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Inf. Softw. Technol., 2026

TiMoS-Net: a multi-temporal image and morphological spatial feature fusion network for predicting neoadjuvant chemotherapy response in breast cancer.

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Biomed. Signal Process. Control., 2026

CL-Guard: Defending DNNs Against Backdoors via Fine-Grained Neuron Analysis and Collaborative Dual-Network Learning.

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Fan Terry Zhang

Proceedings of the Fortieth AAAI Conference on Artificial Intelligence, 2026

2025

Thought Purity: Defense Paradigm For Chain-of-Thought Attack.

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CoRR, July, 2025

HTs-GCN: Identifying Hardware Trojan Nodes in Integrated Circuits Using a Graph Convolutional Network.

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IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., June, 2025

Key Schedule Guided Persistent Fault Attack.

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IEEE Trans. Inf. Forensics Secur., 2025

Pruning for Security: Mitigating Stealthy Bit-Flip Attacks with Efficiency Gains.

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Proceedings of the 24th IEEE International Conference on Trust, 2025

KHAD: K-Hop and Activation-aware Defense against Bit-Flip Attacks in Deep Neural Networks.

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Proceedings of the 24th IEEE International Conference on Trust, 2025

2024

FS-TRA: Evaluating Sequential Circuit Reliability via a Fanout-Source Tracking and Reduction Approach.

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IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., December, 2024

ARA-RCIV: Identifying Reliability-Critical Input Vectors of Logic Circuits Based on the Association Rules Analysis Approach.

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IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., August, 2024

Identifying Reliability High-Correlated Gates of Logic Circuits With Pearson Correlation Coefficient.

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IEEE Trans. Circuits Syst. II Express Briefs, April, 2024

ICP-RL: Identifying Critical Paths for Fault Diagnosis Using Reinforcement Learning.

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ACM Trans. Design Autom. Electr. Syst., January, 2024

A Reliability-Critical Path Identifying Method With Local and Global Adjacency Probability Matrix in Combinational Circuits.

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IEEE Trans. Computers, January, 2024

Biological mechanism of sex differences in mental rotation: Evidence from multimodal MRI, transcriptomic and receptor/transporter data.

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NeuroImage, 2024

Elucidating genetic and molecular basis of altered higher-order brain structure-function coupling in major depressive disorder.

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NeuroImage, 2024

HTV: Measuring Circuit Vulnerability to Hardware Trojan Insertion Based on Node Co-activation Analysis.

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Proceedings of the 23rd IEEE International Conference on Trust, 2024

2023

Estimating Redundancy-Reliability of CNNs Based on Strip-Median Attributes.

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IEEE Trans. Very Large Scale Integr. Syst., October, 2023

Knowledge graph embedding and completion based on entity community and local importance.

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Appl. Intell., October, 2023

A Pruning and Feedback Strategy for Locating Reliability-Critical Gates in Combinational Circuits.

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IEEE Trans. Reliab., September, 2023

2022

Identifying Reliability-Critical Primary Inputs of Combinational Circuits Based on the Model of Gate-Sensitive Attributes.

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IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

BM-RCGL: Benchmarking Approach for Localization of Reliability-Critical Gates in Combinational Logic Blocks.

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IEEE Trans. Computers, 2022

Accelerating stochastic-based reliability estimation for combinational circuits at RTL using GPU parallel computing.

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Int. J. Intell. Syst., 2022

2020

Improving Robustness of Interdependent Networks by Reducing Key Unbalanced Dependency Links.

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IEEE Trans. Circuits Syst., 2020

融合渐近性的灰狼优化支持向量机模型 (Support Vector Machine Model Based on Grey Wolf Optimization Fused Asymptotic).

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Wei William Lee

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计算机科学, 2020

A Stochastic-Based Reliability Calculation Method for RTL Circuits.

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Proceedings of the 2020 International Conferences on Internet of Things (iThings) and IEEE Green Computing and Communications (GreenCom) and IEEE Cyber, 2020

2019

A Fast and Effective Sensitivity Calculation Method for Circuit Input Vectors.

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IEEE Trans. Reliab., 2019

A Locating Method for Reliability-Critical Gates with a Parallel-Structured Genetic Algorithm.

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J. Comput. Sci. Technol., 2019

Circuit reliability prediction based on deep autoencoder network.

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Neurocomputing, 2019

Generalized Synchronization Between Chen System and Rucklidge System.

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IEEE Access, 2019

MC-Unet: Multi-scale Convolution Unet for Bladder Cancer Cell Segmentation in Phase-Contrast Microscopy Images.

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Proceedings of the 2019 IEEE International Conference on Bioinformatics and Biomedicine, 2019

2018

Innovative Savonius rotors evolved by genetic algorithm based on 2D-DCT encoding.

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Shengyong Cheng

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Soft Comput., 2018

Thermal-aware SoC Test Scheduling with Voltage/Frequency Scaling and Test Partition.

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J. Electron. Test., 2018

Laplacian Centrality Peaks Clustering Based on Potential Entropy.

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IEEE Access, 2018

Blockchain Architecture Reliability-Based Measurement for Circuit Unit Importance.

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IEEE Access, 2018

A Novel Trust Evaluation Method for Logic Circuits in IoT Applications Based on the E-PTM Model.

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IEEE Access, 2018

2017

Parameter-free Laplacian centrality peaks clustering.

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Pattern Recognit. Lett., 2017

Coexistence and Local Exponential Stability of Multiple Equilibria in Memristive Neural Networks with a Class of General Nonmonotonic Activation Functions.

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Proceedings of the Advances in Neural Networks - ISNN 2017 - 14th International Symposium, 2017

2016

Circuit reliability estimation based on an iterative PTM model with hybrid coding.

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Microelectron. J., 2016

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