Zhanhui Shi
Orcid: 0000-0003-0770-6690
According to our database1,
Zhanhui Shi authored at least 11 papers
between 2018 and 2026.
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Bibliography
2026
Probabilistic Injection-Based Reliability Evaluation for Correlated Input Vectors in Sequential Circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., February, 2026
2025
An Efficient Area and Reliability Optimization Method for MPRM Circuits Based on High-dimensional Genetic Algorithm.
ACM Trans. Design Autom. Electr. Syst., March, 2025
2024
ARA-RCIV: Identifying Reliability-Critical Input Vectors of Logic Circuits Based on the Association Rules Analysis Approach.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., August, 2024
Identifying Reliability High-Correlated Gates of Logic Circuits With Pearson Correlation Coefficient.
IEEE Trans. Circuits Syst. II Express Briefs, April, 2024
A Reliability-Critical Path Identifying Method With Local and Global Adjacency Probability Matrix in Combinational Circuits.
IEEE Trans. Computers, January, 2024
HTV: Measuring Circuit Vulnerability to Hardware Trojan Insertion Based on Node Co-activation Analysis.
Proceedings of the 23rd IEEE International Conference on Trust, 2024
2022
BM-RCGL: Benchmarking Approach for Localization of Reliability-Critical Gates in Combinational Logic Blocks.
IEEE Trans. Computers, 2022
Locating Critical-Reliability Gates for Sequential Circuits based on the Time Window Graph Model.
Proceedings of the IEEE 31st Asian Test Symposium, 2022
2019
A Locating Method for Reliability-Critical Gates with a Parallel-Structured Genetic Algorithm.
J. Comput. Sci. Technol., 2019
Neurocomputing, 2019
2018
A Novel Trust Evaluation Method for Logic Circuits in IoT Applications Based on the E-PTM Model.
IEEE Access, 2018