Jiongzhe Su
According to our database1,
Jiongzhe Su
authored at least 4 papers
between 2023 and 2025.
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Bibliography
2025
A 40nm 4Mb High-Reliability STT-MRAM Achieving 18ns Write-Time and 94.9% Wafer-Level-Die-Yield Across -55°C-to-125°C.
Proceedings of the IEEE Custom Integrated Circuits Conference, 2025
2024
Proceedings of the Asian Hardware Oriented Security and Trust Symposium, 2024
2023
Proceedings of the IEEE International Conference on Integrated Circuits, 2023
Proceedings of the IEEE International Conference on Integrated Circuits, 2023