Jixuan Wu
This page is a disambiguation page, it actually contains mutiple papers from persons of the same or a similar name.
Bibliography
2025
An Efficient Flash-Based Computing-in-Memory (CIM) Demonstration of High-Precision (32-bit) Nonlinear Partial Differential Equation (PDE) Solver With Ultra-High Endurance and Reliability.
IEEE Trans. Circuits Syst. I Regul. Pap., July, 2025
Retention Accelerated Testing for 3-D QLC nand Flash Memory: Characterization, Analysis, and Modeling.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., July, 2025
High-Precision Error Bit Prediction for 3D QLC NAND Flash Memory: Observations, Analysis, and Modeling.
IEEE Trans. Computers, April, 2025
CoRR, April, 2025
2024
Operation Scheme Optimizations to Achieve Ultra-high Endurance (1010) in Flash Memory with Robust Reliabilities.
CoRR, 2024
A 3D MCAM architecture based on flash memory enabling binary neural network computing for edge AI.
Sci. China Inf. Sci., 2024
Unveiling Cryogenic Performance (4 to 300 K) Towards Ultra-Thin Ferroelectric HZO: Novel Kinetic Barrier Engineering and Underlying Mechanism.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024
2023
Energy-harvesting Q-learning secure routing algorithm with authenticated-encryption for WSN.
ICT Express, December, 2023
Near-threshold-voltage operation in flash-based high-precision computing-in-memory to implement Poisson image editing.
Sci. China Inf. Sci., December, 2023
High-Precision Short-Term Lifetime Prediction in TLC 3-D NAND Flash Memory as Hot-Data Storage.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., October, 2023
Maritime Ship Detection Method for Satellite Images Based on Multiscale Feature Fusion.
IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens., 2023
Microelectron. J., 2023
Grain Size Reduction of Ferroelectric HZO Enabled by a Novel Solid Phase Epitaxy (SPE) Approach: Working Principle, Experimental Demonstration, and Theoretical Understanding.
Proceedings of the 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), 2023
Error Bits Recovering in 3D NAND Flash Memory: A Novel State-Shift Re-Program (SRP) Scheme.
Proceedings of the IEEE International Conference on Integrated Circuits, 2023
Opto-Electronic Monolayer ZnO Memristor Produced via Low Temperature Atomic Layer Deposition.
Proceedings of the IEEE International Conference on Integrated Circuits, 2023
Simulation for the Feasibility of IGZO Channel in 3D Vertical FeFET Memory Based on TCAD.
Proceedings of the IEEE International Conference on Integrated Circuits, 2023
Analyzing Weibo Data with Word2Vec and BiLSTM to Encourage Personal Income Tax Compliance in China.
Proceedings of the 15th International Conference on Machine Learning and Computing, 2023
One-shot Read Processing to Enhance Cold Data Retention in Charge-trap TLC 3D NAND Flash.
Proceedings of the 15th IEEE International Conference on ASIC, 2023
Flash-based Computing-in-memory Architectures with High-accuracy and Robust Reliabilities for General-purpose Applications.
Proceedings of the 15th IEEE International Conference on ASIC, 2023
2022
Proceedings of the 4th International Conference on Robotics, 2022
Large Suppression to Lateral Charge Migration (LCM) Related Error Bits in Charge-Trap TLC 3D NAND Flash.
Proceedings of the 2022 IEEE International Conference on Integrated Circuits, 2022
Work-in-Progress: High-Precision Short-Term Lifetime Prediction in TLC 3D NAND Flash Memory as Hot-data Storage.
Proceedings of the International Conference on Compilers, 2022
2019
Program/Erase Cycling Enhanced Lateral Charge Diffusion in Triple-Level Cell Charge-Trapping 3D NAND Flash Memory.
Proceedings of the IEEE International Reliability Physics Symposium, 2019