Joonhwan Yi

According to our database, Joonhwan Yi authored at least 13 papers between 2001 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

An interpolation method for strong barrel lens distortion.

Changwon Choi, Hyungkeun Lee, Joonhwan Yi

Vis. Comput., 2018

2016

Modeling and performance analysis for a receiver-initiated MAC protocol in wireless sensor networks.

Joonhwan Yi, Hyungkeun Lee

Int. J. Distributed Sens. Networks, 2016

Register grouping for synthesis of clock gating logic.

Inhak Han, Jonggyu Kim, Joonhwan Yi, Youngsoo Shin

Proceedings of the International Conference on IC Design and Technology, 2016

2015

A Receiver-Initiated MAC Protocol for Wireless Sensor Networks Based on Tree Topology.

Inhye Park, Joonhwan Yi, Hyungkeun Lee

Int. J. Distributed Sens. Networks, 2015

Power modeling for digital circuits with clock gating.

Joonhwan Yi, Jong-Gyu Kim

IEICE Electron. Express, 2015

2012

Robust Coupling Delay Test Sets.

Joonhwan Yi, John P. Hayes

J. Electron. Test., 2012

2011

A data flow optimization method for high speed MAC processing in an IEEE 802.16m modem.

Kyung Won Kim, Joonhwan Yi, Seong-Jun Oh

IEICE Electron. Express, 2011

2007

Industrial experience with cycle error computation of cycle-accurate transaction level models.

Junghee Lee, Joonhwan Yi

Proceedings of the 2007 IEEE International SOC Conference, 2007

2006

High-level delay test generation for modular circuits.

Joonhwan Yi, John P. Hayes

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006

Cycle error correction in asynchronous clock modeling for cycle-based simulation.

Junghee Lee, Joonhwan Yi

Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, 2006

2005

The Coupling Model for Function and Delay Faults.

Joonhwan Yi, John P. Hayes

J. Electron. Test., 2005

2002

High -level function and delay testing for digital circuits.

Joonhwan Yi

PhD thesis, 2002

2001

A fault model for function and delay testing.

Joonhwan Yi, John P. Hayes

Proceedings of the 6th European Test Workshop, 2001