Ju Kwang Kim

According to our database1, Ju Kwang Kim authored at least 4 papers between 2024 and 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2025
Impact of Bi-Layer Gate Stack and Thickness on Low Frequency TDDB in FinFET and Planar Devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2025

The Impact of Silicon Concentration on the Reliability of Tungsten Silicide.
Proceedings of the IEEE International Reliability Physics Symposium, 2025

2024
Impacts of Post-Cu CMP Queue Time on Reliability.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

A Systematic Study of HCI Improvement in FinFET with Source/Drain Implant and Geometry Modulation.
Proceedings of the IEEE International Reliability Physics Symposium, 2024


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