Junehwan Kim
According to our database1,
Junehwan Kim
authored at least 2 papers
between 2024 and 2025.
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Bibliography
2025
Impact of Bi-Layer Gate Stack and Thickness on Low Frequency TDDB in FinFET and Planar Devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2025
2024
Proceedings of the IEEE International Reliability Physics Symposium, 2024