Junehwan Kim

According to our database1, Junehwan Kim authored at least 2 papers between 2024 and 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2025
Impact of Bi-Layer Gate Stack and Thickness on Low Frequency TDDB in FinFET and Planar Devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2025

2024
Impacts of Post-Cu CMP Queue Time on Reliability.
Proceedings of the IEEE International Reliability Physics Symposium, 2024


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