Kaupo Kukli

Orcid: 0000-0002-5821-0364

According to our database1, Kaupo Kukli authored at least 4 papers between 2005 and 2014.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2014
Single-parameter model for the post-breakdown conduction characteristics of HoTiO<sub>x</sub>-based MIM capacitors.
Microelectron. Reliab., 2014

2007
Single band electronic conduction in hafnium oxide prepared by atomic layer deposition.
Microelectron. Reliab., 2007

Experimental observations of temperature-dependent flat band voltage transients on high-k dielectrics.
Microelectron. Reliab., 2007

2005
Electrical characterization of hafnium oxide and hafnium-rich silicate films grown by atomic layer deposition.
Microelectron. Reliab., 2005


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