Hei Wong

According to our database1, Hei Wong authored at least 63 papers between 2001 and 2020.

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Bibliography

2020
CMOS low power split-drain MAGFET based magnetic field strength sensor.
Microelectron. J., 2020

2018
High-Speed Discrete Gaussian Sampler With Heterodyne Chaotic Laser Inputs.
IEEE Trans. Circuits Syst. II Express Briefs, 2018

A double snapback SCR ESD protection scheme for 28 nm CMOS process.
Microelectron. Reliab., 2018

Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress.
Microelectron. Reliab., 2018

Lightweight Secure Processor Prototype on FPGA.
Proceedings of the 28th International Conference on Field Programmable Logic and Applications, 2018

2017
A Bias-Bounded Digital True Random Number Generator Architecture.
IEEE Trans. Circuits Syst. I Regul. Pap., 2017

2016
The variation of the leakage current characteristics of W/Ta<sub>2</sub>O<sub>5</sub>/W MIM capacitors with the thickness of the bottom W electrode.
Microelectron. Reliab., 2016

Comparative study of reliability degradation behaviors of LDMOS and LDMOS-SCR ESD protection devices.
Microelectron. Reliab., 2016

Simulation and evaluation of the peak temperature in LED light bulb heatsink.
Microelectron. Reliab., 2016

Effects of thermal annealing on the charge localization characteristics of HfO<sub>2</sub>/Au/HfO<sub>2</sub> stack.
Microelectron. Reliab., 2016

Editorial.
Microelectron. Reliab., 2016

2015
A high-efficiency full-wave CMOS rectifying charge pump for RF energy harvesting applications.
Microelectron. J., 2015

Optimization of loss tangent and capacitor size of micro-vacuum dielectric capacitors.
Microelectron. J., 2015

A dynamic-biasing 4× charge pump based on exponential topology.
Int. J. Circuit Theory Appl., 2015

Low-voltage CMOS DC-DC converters for energy harvesting applications.
Proceedings of the 2015 IEEE 11th International Conference on ASIC, 2015

2014
Snapback breakdown ESD device based on zener diodes on silicon-on-insulator technology.
Microelectron. Reliab., 2014

Thermal stability of sectorial split-drain magnetic field-effect transistors.
Microelectron. Reliab., 2014

On the current conduction mechanisms of CeO<sub>2</sub>/La<sub>2</sub>O<sub>3</sub> stacked gate dielectric.
Microelectron. Reliab., 2014

Temperature dependences of threshold voltage and drain-induced barrier lowering in 60 nm gate length MOS transistors.
Microelectron. Reliab., 2014

Special section reliability and variability of devices for circuits and systems.
Microelectron. Reliab., 2014

2013
Thermal and voltage instabilities of hafnium oxide films prepared by sputtering technique.
Microelectron. Reliab., 2013

Editorial.
J. Circuits Syst. Comput., 2013

2012
Improving the electrical characteristics of MOS transistors with CeO<sub>2</sub>/La<sub>2</sub>O<sub>3</sub> stacked gate dielectric.
Microelectron. Reliab., 2012

A comparative study of charge pumping circuits for flash memory applications.
Microelectron. Reliab., 2012

Advances in non-volatile memory technology.
Microelectron. Reliab., 2012

Modeling of terminal ring structures for high-voltage power MOSFETs.
Microelectron. Reliab., 2012

Influence of multi-finger layout on the subthreshold behavior of nanometer MOS transistors.
Microelectron. Reliab., 2012

Degradation behaviors of GaN light-emitting diodes under high-temperature and high-current stressing.
Microelectron. Reliab., 2012

ICMAT 2011 - Reliability and variability of semiconductor devices and ICs.
Microelectron. Reliab., 2012

2011
Off-state drain breakdown mechanisms of VDMOS with anti-JFET implantation.
Microelectron. Reliab., 2011

An overview of charge pumping circuits for flash memory applications.
Proceedings of the 2011 IEEE 9th International Conference on ASIC, 2011

2010
Modeling of high-frequency characteristics for epoxy-sealed micro vacuum capacitors.
Microelectron. Reliab., 2010

Analysis of ESD discharge current distribution and area optimization of VDMOS gate protection structure.
Microelectron. Reliab., 2010

Generating sub-1V reference voltages from a resistorless CMOS bandgap reference circuit by using a piecewise curvature temperature compensation technique.
Microelectron. Reliab., 2010

Modeling the charge transport mechanism in amorphous Al<sub>2</sub>O<sub>3</sub> with multiphonon trap ionization effect.
Microelectron. Reliab., 2010

An Energy Efficient Half-Static Clock-Gating d-Type flip-Flop.
J. Circuits Syst. Comput., 2010

2009
Effects of periphery encapsulation material on the characteristics of micro vacuum dielectric capacitor.
Microelectron. Reliab., 2009

Hot-carrier reliability and breakdown characteristics of multi-finger RF MOS transistors.
Microelectron. Reliab., 2009

Subthreshold parameters of radio-frequency multi-finger nanometer MOS transistors.
Microelectron. Reliab., 2009

Temperature-dependent light-emitting characteristics of InGaN/GaN diodes.
Microelectron. Reliab., 2009

Area Efficient 2<sup>n</sup>× Switched Capacitor Charge Pump.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2009), 2009

2008
Silicon oxynitride integrated waveguide for on-chip optical interconnects applications.
Microelectron. Reliab., 2008

Effects of aluminum incorporation on hafnium oxide film using plasma immersion ion implantation.
Microelectron. Reliab., 2008

Design strategy for 2-phase switched capacitor charge pump.
Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2008

Current mode track and hold circuit with 50MS/sec speed and 8-bit resolution.
Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2008

A Wideband three-stage rail-to-rail power amplifier driving large capacitive load.
Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2008

2007
Silicon integrated photonics begins to revolutionize.
Microelectron. Reliab., 2007

Single band electronic conduction in hafnium oxide prepared by atomic layer deposition.
Microelectron. Reliab., 2007

Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation.
Microelectron. Reliab., 2007

2006
Minimizing hydrogen content in silicon oxynitride by thermal oxidation of silicon-rich silicon nitride.
Microelectron. Reliab., 2006

Definition of curve fitting parameter to study tunneling and trapping of electrons in Si/ultra-thin SiO<sub>2</sub>/metal structures.
Microelectron. Reliab., 2006

2005
Dielectric breakdown characteristics and interface trapping of hafnium oxide films.
Microelectron. J., 2005

2004
Conduction mechanisms in MOS gate dielectric films.
Microelectron. Reliab., 2004

2003
Low-frequency noise study in electron devices: review and update.
Microelectron. Reliab., 2003

Electrical characterization of the hafnium oxide prepared by direct sputtering of Hf in oxygen with rapid thermal annealing.
Microelectron. Reliab., 2003

Onefold coordinated oxygen atom: an electron trap in the silicon oxide.
Microelectron. Reliab., 2003

Oxynitride gate dielectric prepared by thermal oxidation of low-pressure chemical vapor deposition silicon-rich silicon nitride.
Microelectron. Reliab., 2003

2002
Ultra-shallow n<sup>+</sup>p junction formed by PH<sub>3</sub> and AsH<sub>3</sub> plasma immersion ion implantation.
Microelectron. Reliab., 2002

Defects in silicon oxynitride gate dielectric films.
Microelectron. Reliab., 2002

Recent developments in silicon optoelectronic devices.
Microelectron. Reliab., 2002

A novel approach for fabricating light-emitting porous polysilicon films.
Microelectron. Reliab., 2002

2001
Investigation of the surface silica layer on porous poly-Si thin films.
Microelectron. Reliab., 2001

SIMS study of silicon oxynitride prepared by oxidation of silicon-rich silicon nitride layer.
Microelectron. Reliab., 2001


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