Kenneth F. Galloway

According to our database1, Kenneth F. Galloway authored at least 2 papers between 2001 and 2006.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Awards

IEEE Fellow

IEEE Fellow 1986, "For contributions to the study of radiation effects in microelectronics.".

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2006
Single event burnout in power diodes: Mechanisms and models.
Microelectron. Reliab., 2006

2001
A generalized model for the lifetime of microelectronic components, applied to storage conditions.
Microelectron. Reliab., 2001


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