Krzysztof Gajewski

According to our database, Krzysztof Gajewski authored at least 2 papers between 2015 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2024

Conductive Atomic Force Microscopy - Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface's Electrical Properties.

Andrzej Sikora, Krzysztof Gajewski, Dominik Badura, Bartosz Pruchnik, Tomasz Piasecki, Kamil Raczkowski, Teodor P. Gotszalk

Sensors, September, 2024

2015

Self-supporting graphene films and their applications.

Stefan Goniszewski, John C. Gallop, Mohammad Adabi, Krzysztof Gajewski, Olena Shaforost, Norbert Klein, Andrzej Sierakowski, Jie Chen, Yifang Chen, Teodor P. Gotszalk, Ling Hao

IET Circuits Devices Syst., 2015