Teodor P. Gotszalk

According to our database, Teodor P. Gotszalk authored at least 8 papers between 2002 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2019

Sensitivity Improvement to Active Piezoresistive AFM Probes Using Focused Ion Beam Processing.

Piotr Kunicki, Tihomir Angelov, Tzvetan Ivanov, Teodor P. Gotszalk, Ivo Rangelow

Sensors, 2019

2018

Optimal Design of Electromagnetically Actuated MEMS Cantilevers.

Paolo Di Barba, Teodor P. Gotszalk, Wojciech Majstrzyk, Maria Evelina Mognaschi, Karolina Orlowska, Slawomir Wiak, Andrzej Sierakowski

Sensors, 2018

2016

New approach for a multi-cantilever arrays sensor system with advanced MOEMS readout.

Francesco Ivaldi, Tomasz Bieniek, Pawel Janus, Jerzy Zajac, Piotr Grabiec, Wojciech Majstrzyk, D. Kopiec, Teodor P. Gotszalk

Proceedings of the 46th European Solid-State Device Research Conference, 2016

2015

Self-supporting graphene films and their applications.

Stefan Goniszewski, John C. Gallop, Mohammad Adabi, Krzysztof Gajewski, Olena Shaforost, Norbert Klein, Andrzej Sierakowski, Jie Chen, Yifang Chen, Teodor P. Gotszalk, Ling Hao

IET Circuits Devices Syst., 2015

2011

Standard and self-sustained magnetron sputtering deposited Cu films investigated by means of AFM and XRD.

Artur Wiatrowski, W. M. Posadowski, Grzegorz Józwiak, Jaroslaw Serafinczuk, R. F. Szeloch, Teodor P. Gotszalk

Microelectron. Reliab., 2011

The regularized blind tip reconstruction algorithm as a scanning probe microscopy tip metrology method

Grzegorz Józwiak, A. Henrykowski, A. Masalska, Teodor P. Gotszalk, I. Ritz, H. Steigmann

CoRR, 2011

2009

Data Modeling for Tools and Technologies for the Analysis and Synthesis of NANOstructures (TASNANO) Project.

Mauro Giacomini, Laura Pastorino, Federico Caneva Soumetz, J. A. Mielczarski, E. Mielczarski, Ivo Rangelow, Teodor P. Gotszalk

J. Inf. Technol. Res., 2009

2002

Scanning Thermal Microscopy in Microsystem Reliability Analysis.

R. F. Szeloch, Teodor P. Gotszalk, Pawel Janus

Microelectron. Reliab., 2002