Laurent Duraffourg

According to our database, Laurent Duraffourg authored at least 8 papers between 2008 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2016

Torsional nano-resonator: Characterization of a nonlinear hardening behavior and noise analysis.

Ludovic Laurent, Jean-Jacques Yon, Jean-Sebastien Moulet, Pierre Imperinetti, Laurent Duraffourg

Proceedings of the 2016 IEEE SENSORS, Orlando, FL, USA, October 30 - November 3, 2016, 2016

2015

Piezoresistive transduction optimization of p-doped poly-Silicon NEMS.

Issam Ouerghi, Willy Ludurczak, Laurent Duraffourg, Carine Ladner, Anouar Idrissi-El Oudrhiri, Patrice Gergaud, Maud Vinet, Thomas Ernst

Proceedings of the 45th European Solid State Device Research Conference, 2015

High performance NEMS devices for sensing applications.

Thomas Ernst, Sebastien Hentz, Julien Arcamone, Vincent Agache, Laurent Duraffourg, Issam Ouerghi, Willy Ludurczak, Carine Ladner, Eric Ollier, Philippe Andreucci, Éric Colinet, Pierre Puget

Proceedings of the 45th European Solid State Device Research Conference, 2015

2013

Bayesian inversion of multi-mode NEMS mass spectrometry signal.

R. Perenon, Eric Sage, Ali Mohammad-Djafari, Laurent Duraffourg, Sebastien Hentz, A. Brenac, Robert Morel, P. Grangeat

Proceedings of the 21st European Signal Processing Conference, 2013

Impact of process variability on a frequency-addressed NEMS array sensor used for gravimetric detection.

Olivier Martin, Éric Colinet, Eric Sage, Cecilia Dupre, Patrick Villard, Sebastien Hentz, Laurent Duraffourg, Thomas Ernst

Proceedings of the European Solid-State Device Research Conference, 2013

2012

Towards ultra-dense arrays of VHF NEMS with FDSOI-CMOS active pixels for sensing applications.

Gregory Arndt, Cecilia Dupre, Julien Arcamone, Gerald Cibrario, Olivier Rozeau, Laurent Duraffourg, Eric Ollier, Éric Colinet

Proceedings of the 2012 IEEE International Solid-State Circuits Conference, 2012

2009

Ultra-Sensitive Capacitive Detection Based on SGMOSFET Compatible With Front-End CMOS Process.

Éric Colinet, Cedric Durand, Laurent Duraffourg, Patrick Audebert, Guillaume Dumas, Fabrice Casset, Eric Ollier, Pascal Ancey, Jean-François Carpentier, Lionel Buchaillot, Adrian M. Ionescu

IEEE J. Solid State Circuits, 2009

2008

Measurement of Nano-Displacement Based on In-Plane Suspended-Gate MOSFET Detection Compatible with a Front-End CMOS Process.

Éric Colinet, Cedric Durand, Patrick Audebert, Philippe Renaux, Denis Mercier, Laurent Duraffourg, Eric Ollier, Fabrice Casset, Pascal Ancey, Lionel Buchaillot, Adrian M. Ionescu

Proceedings of the 2008 IEEE International Solid-State Circuits Conference, 2008