Liming Tsau

According to our database, Liming Tsau authored at least 2 papers between 2021 and 2023.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2023

Scaling Trends and the Effect of Process Variations on the Soft Error Rate of advanced FinFET SRAMs.

Balaji Narasimham, H. Luk, C. Paone, A-R. Montoya, T. Riehle, Mike Smith, Liming Tsau

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2021

Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm FinFET.

Balaji Narasimham, Vikas Chaudhary, Mike Smith, Liming Tsau, Dennis R. Ball, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2021