Balaji Narasimham

According to our database, Balaji Narasimham authored at least 13 papers between 2015 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

Scaling Trends and the Effect of Process Variations on the Soft Error Rate of advanced FinFET SRAMs.

Balaji Narasimham, H. Luk, C. Paone, A-R. Montoya, T. Riehle, Mike Smith, Liming Tsau

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment.

Yoni Xiong, Alexandra Feeley, Nicholas J. Pieper, Dennis R. Ball, Balaji Narasimham, John Brockman, N. A. Dodds, S. A. Wender, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm FinFET.

Balaji Narasimham, Vikas Chaudhary, Mike Smith, Liming Tsau, Dennis R. Ball, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology.

Alexandra Feeley, Yoni Xiong, Bharat L. Bhuva, Balaji Narasimham, Shi-Ji Wen, Rita Fung

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology.

Jingchen Cao, Lyuan Xu, Shi-Jie Wen, Rita Fung, Balaji Narasimham, Lloyd W. Massengill, Bharat L. Bhuva

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Soft Error Performance of High-Speed Pulsed-DICE-Latch Design in 16 nm and 7 nm FinFET Processes.

Balaji Narasimham, K. Chandrasekharan, J. K. Wang, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies.

Jingchen Cao, Lyuan Xu, Bharat L. Bhuva, Shi-Jie Wen, Richard Wong, Balaji Narasimham, Lloyd W. Massengill

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Evaluation on flip-flop physical unclonable functions in a 14/16-nm bulk FinFET technology.

H. Zhang, H. Jiang, M. R. Eaker, Kurt J. Lezon, Balaji Narasimham, Nihaar N. Mahatme, Lloyd W. Massengill, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Evaluation of the system-level SER performance of gigabit ethernet transceiver devices.

Balaji Narasimham, Tim Wu, Jung K. Wang, Bruce Conway

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Scaling trends and bias dependence of the soft error rate of 16 nm and 7 nm FinFET SRAMs.

Balaji Narasimham, Saket Gupta, Daniel S. Reed, J. K. Wang, Nick Hendrickson, Hasan Taufique

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Designing soft-error-aware circuits with power and speed optimization.

H. Jiang, H. Zhang, Balaji Narasimham, Lloyd W. Massengill, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2015

Influence of supply voltage on the multi-cell upset soft error sensitivity of dual- and triple-well 28 nm CMOS SRAMs.

Balaji Narasimham, Jung K. Wang, Narayana Vedula, Saket Gupta, Brandon Bartz, Carl Monzel, Indranil Chatterjee, Bharat L. Bhuva, Ronald D. Schrimpf, Robert A. Reed

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Terrestrial SER characterization for nanoscale technologies: A comparative study.

Nihaar N. Mahatme, Bharat L. Bhuva, Nelson J. Gaspard, T. Assis, Y. Xu, P. Marcoux, M. Vilchis, Balaji Narasimham, A. Shih, Shi-Jie Wen, Rick Wong, N. Tam, M. Shroff, S. Koyoma, A. Oates

Proceedings of the IEEE International Reliability Physics Symposium, 2015