Lung-Jen Lee

According to our database, Lung-Jen Lee authored at least 12 papers between 2007 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2019

A Low-Complexity Color Image Compression Algorithm Based on AMBTC.

Hsiao-Hsuan Cheng, Chiung-An Chen, Lung-Jen Lee, Ting-Lan Lin, Yih-Shyh Chiou, Shih-Lun Chen

Proceedings of the IEEE International Conference on Consumer Electronics - Taiwan, 2019

2013

Observation-Oriented ATPG and Scan Chain Disabling for Capture Power Reduction.

Lung-Jen Lee

J. Electron. Test., 2013

2012

$2^{n}$ Pattern Run-Length for Test Data Compression.

Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Cheng-Ho Chang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

Dual-LFSR Reseeding for Low Power Testing.

Lung-Jen Lee, Wang-Dauh Tseng, Wen-Ting Yang

Proceedings of the 13th International Workshop on Microprocessor Test and Verification, 2012

Two-Way Multicasting for Test Data Compression.

Lung-Jen Lee, Wang-Dauh Tseng, Wei-Shun Chen

Proceedings of the 13th International Workshop on Microprocessor Test and Verification, 2012

Deterministic ATPG for Low Capture Power Testing.

Lung-Jen Lee, Chia-Cheng He, Wang-Dauh Tseng

Proceedings of the 13th International Workshop on Microprocessor Test and Verification, 2012

2010

Deterministic built-in self-test using multiple linear feedback shift registers for test power and test volume reduction.

Wang-Dauh Tseng, Lung-Jen Lee, Rung-Bin Lin

IET Comput. Digit. Tech., 2010

Test Data Compression Using Multi-dimensional Pattern Run-length Codes.

Wang-Dauh Tseng, Lung-Jen Lee

J. Electron. Test., 2010

2009

Deterministic Built-In Self-Test Using Multiple Linear Feedback Shift Registers for Low-Power Scan Testing.

Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Chi-Wei Yu

Proceedings of the Eighteentgh Asian Test Symposium, 2009

A Multi-dimensional Pattern Run-Length Method for Test Data Compression.

Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Chen-Lun Lee

Proceedings of the Eighteentgh Asian Test Symposium, 2009

2008

Power Reduction during Scan Testing Based on Multiple Capture Technique.

Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin

IEICE Trans. Electron., 2008

2007

Reduction of Power Dissipation during Scan Testing by Test Vector Ordering.

Wang-Dauh Tseng, Lung-Jen Lee

Proceedings of the Eighth International Workshop on Microprocessor Test and Verification (MTV 2007), 2007