M. Elangovan

According to our database, M. Elangovan authored at least 13 papers between 2010 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2024

Read Improved and Low Leakage Power CNTFET Based Hybrid 10t SRAM Cell for Low Power Applications.

M. Elangovan, Kulbhushan Sharma, Ashish Sachdeva, Lipika Gupta

Circuits Syst. Signal Process., March, 2024

2023

High-Stability and High-Speed 11T CNTFET SRAM Cell for MIMO Applications.

M. Elangovan, G. Saravanan, S. Jayanthi, P. Raja, Kulbhushan Sharma, S. Nireshkumar

J. Circuits Syst. Comput., November, 2023

Erratum: Diode Connected Transistor-Based Low PDP Adiabatic Full Adder in 7nm FINFET Technology for MIMO Applications.

A. Venkatesan, P. T. Vanathi, M. Elangovan

J. Circuits Syst. Comput., September, 2023

Diode Connected Transistor-Based Low PDP Adiabatic Full Adder in 7 nm FINFET Technology for MIMO Applications.

A. Venkatesan, P. T. Vanathi, M. Elangovan

J. Circuits Syst. Comput., May, 2023

2022

Design of High Stability and Low Power 7T SRAM Cell in 32-NM CNTFET Technology.

M. Elangovan, M. Muthukrishnan

J. Circuits Syst. Comput., 2022

A Low-Power and High-Stability 8T SRAM Cell with Diode-Connected Transistors.

M. Elangovan, M. Muthukrishnan

J. Circuits Syst. Comput., 2022

2021

A Novel Darlington-Based 8T CNTFET SRAM Cell for Low Power Applications.

M. Elangovan

J. Circuits Syst. Comput., 2021

2020

High Stable and Low Power 8T CNTFET SRAM Cell.

M. Elangovan, K. Gunavathi

J. Circuits Syst. Comput., 2020

High Stable and Low Power 10T CNTFET SRAM Cell.

M. Elangovan, K. Gunavathi

J. Circuits Syst. Comput., 2020

2014

Tool condition monitoring using K-star algorithm.

Sanidhya Painuli, M. Elangovan, V. Sugumaran

Expert Syst. Appl., 2014

2011

Effect of SVM kernel functions on classification of vibration signals of a single point cutting tool.

M. Elangovan, V. Sugumaran, K. I. Ramachandran, S. Ravikumar

Expert Syst. Appl., 2011

Evaluation of expert system for condition monitoring of a single point cutting tool using principle component analysis and decision tree algorithm.

M. Elangovan, S. Babu Devasenapati, N. R. Sakthivel, K. I. Ramachandran

Expert Syst. Appl., 2011

2010

Studies on Bayes classifier for condition monitoring of single point carbide tipped tool based on statistical and histogram features.

M. Elangovan, K. I. Ramachandran, V. Sugumaran

Expert Syst. Appl., 2010