F. Guyader

According to our database, F. Guyader authored at least 2 papers between 2002 and 2003.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of four.

2003

Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices.

M. Fadlallah, C. Petit, A. Meinertzhagen, Gérard Ghibaudo, M. Bidaud, O. Simonetti, F. Guyader

Microelectron. Reliab., 2003

2002

Validated 90nm CMOS Technology Platform with Low-k Copper Interconnects for Advanced System-on-Chip (SoC).

Thierry Devoivre, M. Lunenborg, C. Julien, J.-P. Carrere, P. Ferreira, W. J. Toren, A. VandeGoor, P. Gayet, T. Berger, O. Hinsinger, P. Vannier, Y. Trouiller, Y. Rody, P.-J. Goirand, R. Palla, I. Thomas, F. Guyader, David Roy, B. Borot, Nicolas Planes, Sylvie Naudet, F. Pico, D. Duca, F. Lalanne, D. Heslinga, M. Haond

Proceedings of the 10th IEEE International Workshop on Memory Technology, 2002