M. Marin

According to our database, M. Marin authored at least 3 papers between 2004 and 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2008

Impact of inside spacer process on fully self-aligned 250 GHz SiGe: C HBTs reliability performances: a-Si vs. nitride.

Malick Diop, Nathalie Revil, M. Marin, Frederic Monsieur, Pascal Chevalier, Gérard Ghibaudo

Microelectron. Reliab., 2008

2005

Dc and low frequency noise analysis of hot-carrier induced degradation of low complexity 0.13 mum CMOS bipolar transistors.

P. Benoit, Jérémy Raoult, C. Delseny, Fabien Pascal, L. Snadny, J. C. Vildeuil, M. Marin, B. Martinet, D. Cottin, Olivier Noblanc

Microelectron. Reliab., 2005

2004

Low frequency noise characterization in 0.13 mum p-MOSFETs. Impact of scaled-down 0.25, 0.18 and 0.13 mum technologies on 1/f noise.

M. Marin, Y. Akue Allogo, M. de Murcia, P. Llinares, J. C. Vildeuil

Microelectron. Reliab., 2004