Jérémy Raoult

According to our database1, Jérémy Raoult authored at least 12 papers between 2005 and 2020.

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Bibliography

2020
Finding EM leakages at design stage: a simulation methodology.
IACR Cryptol. ePrint Arch., 2020

2017
Optimization of Near-Field Image Capture With Millimeter-Wave Bow-Tie Probes.
IEEE Trans. Instrum. Meas., 2017

Out-of-band disturbance of mm-wave EMI on RF front-ends.
Microelectron. Reliab., 2017

2015
60 GHz active microscopy with a bow-tie antenna as near-field probe.
Proceedings of the 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2015

Electromagnetic coupling circuit model of a magnetic near-field probe to a microstrip line.
Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015

Large domain validity of MOSFET microwave-rectification response.
Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015

Preliminary study of Automatic Control Gain loop subjected to pulse-modulated radiofrequency interference.
Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015

2014
Electromagnetic analysis, deciphering and reverse engineering of integrated circuits (E-MATA HARI).
Proceedings of the 22nd International Conference on Very Large Scale Integration, 2014

2013
An optimizing technique to lower both phase noise and susceptibility of a voltage controlled oscillator.
Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013

Discrete low-frequency transistors subjected to high-frequency CW and pulse-modulated sine signals.
Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013

2011
First studies of the impact of dose radiation on the electromagnetic susceptibility of bipolar transistors.
Proceedings of the 12th Latin American Test Workshop, 2011

2005
Dc and low frequency noise analysis of hot-carrier induced degradation of low complexity 0.13 mum CMOS bipolar transistors.
Microelectron. Reliab., 2005


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