Maheshwar Chandrasekar
According to our database1,
Maheshwar Chandrasekar
authored at least 10 papers
between 2008 and 2016.
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Bibliography
2016
A novel diagnostic test generation methodology and its application in production failure isolation.
Proceedings of the 2016 IEEE International Test Conference, 2016
2011
Proceedings of the VLSI Design 2011: 24th International Conference on VLSI Design, 2011
A Novel Learning Framework for State Space Exploration Based on Search State Extensibility Relation.
Proceedings of the VLSI Design 2011: 24th International Conference on VLSI Design, 2011
2010
Search State Extensibility based Learning Framework for Model Checking and Test Generation.
PhD thesis, 2010
Search State Compatibility Based Incremental Learning Framework and Output Deviation Based X-filling for Diagnostic Test Generation.
J. Electron. Test., 2010
Proceedings of the 19th IEEE Asian Test Symposium, 2010
2009
Fast circuit topology based method to configure the scan chains in Illinois Scan architecture.
Proceedings of the 2009 IEEE International Test Conference, 2009
Diagnostic Test Generation for silicon diagnosis with an incremental learning framework based on search state compatibility.
Proceedings of the IEEE International High Level Design Validation and Test Workshop, 2009
Proceedings of the 47th Annual Southeast Regional Conference, 2009
2008
Proceedings of the 18th ACM Great Lakes Symposium on VLSI 2008, 2008