Makoto Eiki

According to our database, Makoto Eiki authored at least 5 papers between 2021 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Efficient Wafer-Level Spatial Variation Modeling for Multi-Site RF IC Testing.

Riaz-ul-haque Mian, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki, Michihiro Shintani

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2024

2023

Improving Efficiency and Robustness of Gaussian Process Based Outlier Detection via Ensemble Learning.

Makoto Eiki, Tomoki Nakamura, Masuo Kajiyama, Michiko Inoue, Takashi Sato, Michihiro Shintani

Proceedings of the IEEE International Test Conference, 2023

Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects.

Takuma Nagao, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki, Michiko Inoue, Michihiro Shintani

Proceedings of the 28th Asia and South Pacific Design Automation Conference, 2023

2022

Accurate Failure Rate Prediction Based on Gaussian Process Using WAT Data.

Makoto Eiki, Tomoki Nakamura, Masuo Kajiyama, Michiko Inoue, Michihiro Shintani

Proceedings of the IEEE International Test Conference, 2022

2021

Wafer-level Variation Modeling for Multi-site RF IC Testing via Hierarchical Gaussian Process.

Michihiro Shintani, Riaz-ul-haque Mian, Michiko Inoue, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki

Proceedings of the IEEE International Test Conference, 2021