Marampally Saikiran

Orcid: 0000-0002-1178-4600

According to our database1, Marampally Saikiran authored at least 11 papers between 2020 and 2023.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

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Bibliography

2023
A Power Supply Rejection Based Approach for Robust Defect Detection in Operational Amplifiers.
Proceedings of the IEEE East-West Design & Test Symposium, 2023

Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-Efficiency.
Proceedings of the IEEE East-West Design & Test Symposium, 2023

Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview.
Proceedings of the IEEE East-West Design & Test Symposium, 2023

Systematic Methodology to Design High Precision Voltage References with Sub-ppm/°C Temperature Coefficient.
Proceedings of the IEEE East-West Design & Test Symposium, 2023

2022
All Digital Low-Overhead SAR ADC Built-In Self-Test for Fault Detection and Diagnosis.
Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Digital Defect-Oriented Test Methodology for Flipped Voltage Follower Low Dropout (LDO) Voltage Regulators.
Proceedings of the 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2022

A Time-Efficient Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits.
Proceedings of the 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2022

Robust Built-in Defect-Detection for Low Drop-Out Regulators using Digital Mismatch Injection.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

A Wide-Range Low-cost Temperature to Digital Converter Independent of Device Models.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage.
Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

2020
Robust DfT Techniques for Built-in Fault Detection in Operational Amplifiers with High Coverage.
Proceedings of the IEEE International Test Conference, 2020


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