Degang Chen

Affiliations:
  • Iowa State University, Department of Electrical and Computer Engineering, Ames, IA, USA
  • University of California, Santa Barbara, CA, USA (PhD 1992)


According to our database1, Degang Chen authored at least 223 papers between 1993 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Awards

IEEE Fellow

IEEE Fellow 2016, "For contributions to testing of analog and mixed-signal integrated circuits".

Timeline

Legend:

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Links

Online presence:

On csauthors.net:

Bibliography

2023
Site-to-Site Variation in Analog Multisite Testing: A Survey on Its Detection and Correction.
IEEE Des. Test, October, 2023

A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing.
J. Electron. Test., February, 2023

A Compact and Accurate MOS-based Temperature Sensor for Thermal Management.
Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023

Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-Analog Converters with Novel Calibration Algorithm.
Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023

Very Compact Temperature Sensor for Power/Thermal Management.
Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023

Small Area, High Accuracy Sub-Radix Resistive Current Mode Digital-To-Analog Converter with Novel Calibration Algorithm.
Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023

An Architectural Framework for On-Line Health Monitoring of Integrated Circuits.
Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023

An Improved Single-Temperature Trim Technique for 1<sup>st</sup> Order-Compensated Bandgap References.
Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023

Sub-ppm/°C High Performance Voltage Reference.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2023

A Resistorless Precision Curvature-Compensated Bandgap Voltage Reference Based on the VGO Extraction Technique.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2023

A Power Supply Rejection Based Approach for Robust Defect Detection in Operational Amplifiers.
Proceedings of the IEEE East-West Design & Test Symposium, 2023

Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-Efficiency.
Proceedings of the IEEE East-West Design & Test Symposium, 2023

Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview.
Proceedings of the IEEE East-West Design & Test Symposium, 2023

Systematic Methodology to Design High Precision Voltage References with Sub-ppm/°C Temperature Coefficient.
Proceedings of the IEEE East-West Design & Test Symposium, 2023

2022
A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing.
J. Electron. Test., December, 2022

All Digital Low-Overhead SAR ADC Built-In Self-Test for Fault Detection and Diagnosis.
Proceedings of the 40th IEEE VLSI Test Symposium, 2022

The Least-Squares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing.
Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Digital Defect-Oriented Test Methodology for Flipped Voltage Follower Low Dropout (LDO) Voltage Regulators.
Proceedings of the 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2022

A Time-Efficient Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits.
Proceedings of the 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2022

Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing.
Proceedings of the IEEE International Test Conference, 2022

Low Cost High Accuracy Stimulus Generator for On-chip Spectral Testing.
Proceedings of the IEEE International Test Conference, 2022

Robust Built-in Defect-Detection for Low Drop-Out Regulators using Digital Mismatch Injection.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

A Wide-Range Low-cost Temperature to Digital Converter Independent of Device Models.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

Level Shifters for Charge Constrained Applications.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

Hardware Security Vulnerability in Analog Signal Chain Filters.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage.
Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

Graph Theory Approach for Multi-site ATE Board Parameter Extraction.
Proceedings of the IEEE European Test Symposium, 2022

Cross-Correlation Approach to Detecting Issue Test Sites in Massive Parallel Testing.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

2021
Detection of Site to Site Variations From Volume Measurement Data in Multisite Semiconductor Testing.
IEEE Trans. Instrum. Meas., 2021

Fast Gate Leakage Current Monitor With Large Dynamic Range.
IEEE Trans. Circuits Syst. II Express Briefs, 2021

Sub-ppm/°C Bandgap References With Natural Basis Expansion for Curvature Cancellation.
IEEE Trans. Circuits Syst. I Regul. Pap., 2021

A Simple Monitor for Tracking NBTI in Integrated Systems.
Proceedings of the 64th IEEE International Midwest Symposium on Circuits and Systems, 2021

Systematic Hardware Error Identification and Calibration for Massive Multisite Testing.
Proceedings of the IEEE International Test Conference, 2021

An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study.
Proceedings of the 26th IEEE European Test Symposium, 2021

Massive Multisite Variability-Aware Die Distribution Estimation for Analog/Mixed-Signal Circuits Test Validation.
Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021

2020
MIRE: A Multitone Identification and Replacement Method for Multitone Spectral Test Without Requiring Coherent Sampling.
IEEE Trans. Instrum. Meas., 2020

A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test.
IEEE Trans. Instrum. Meas., 2020

An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method.
IEEE Trans. Instrum. Meas., 2020

A 12-Bit 125-MS/s 2.5-Bit/Cycle SAR-Based Pipeline ADC Employing a Self-Biased Gain Boosting Amplifier.
IEEE Trans. Circuits Syst., 2020

An 8-bit Low-Cost String DAC With Gradient Errors Suppression to Achieve 16-bit Linearity.
IEEE Trans. Circuits Syst. I Regul. Pap., 2020

A Transient-Enhanced Output-Capacitorless LDO With Fast Local Loop and Overshoot Detection.
IEEE Trans. Circuits Syst., 2020

Quantile - Quantile Fitting Approach to Detect Site to Site Variations in Massive Multi-site Testing.
Proceedings of the 38th IEEE VLSI Test Symposium, 2020

Three-Junction Bandgap Circuit with Sub 1 ppm/°C Temperature Coefficient.
Proceedings of the 63rd IEEE International Midwest Symposium on Circuits and Systems, 2020

Least Square Based Jitter Decomposition Algorithm for a PAM4 link.
Proceedings of the 63rd IEEE International Midwest Symposium on Circuits and Systems, 2020

Robust DfT Techniques for Built-in Fault Detection in Operational Amplifiers with High Coverage.
Proceedings of the IEEE International Test Conference, 2020

A Low-Power and Area-Efficient Analog Duty Cycle Corrector for ADC's External Clocks.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2020

A Simple Bandgap Reference Based on VGO Extraction with Single-Temperature Trimming.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2020

2019
Low-Cost, High-Precision DAC Design Based on Ordered Element Matching.
IEEE Trans. Circuits Syst. I Regul. Pap., 2019

An Accurate and Efficient Method for Eliminating the Requirement of Coherent Sampling in Multi-Tone Test.
Proceedings of the 37th IEEE VLSI Test Symposium, 2019

A Precision Bandgap Voltage Reference Using Curvature Elimination Technique.
Proceedings of the 62nd IEEE International Midwest Symposium on Circuits and Systems, 2019

Built-in self-test and self-calibration for analog and mixed signal circuits.
Proceedings of the IEEE International Test Conference, 2019

Bandgap Voltage VGO Extraction with Two-Temperature Trimming for Designing Sub-ppm/°C Voltage References.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2019

2018
High-Purity Sine Wave Generation Using Nonlinear DAC With Predistortion Based on Low-Cost Accurate DAC-ADC Co-Testing.
IEEE Trans. Instrum. Meas., 2018

Improving Time-Efficiency of Fault-Coverage Simulation for MOS Analog Circuit.
IEEE Trans. Circuits Syst. I Regul. Pap., 2018

USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test.
IEEE Trans. Circuits Syst. I Regul. Pap., 2018

Fast and accurate linearity test for DACs with various architectures using segmented models.
Proceedings of the IEEE International Test Conference, 2018

Cost-Effective High Purity Signal Generator Using Pre-distortion.
Proceedings of the IEEE International Test Conference in Asia, 2018

Accurate Spectral Testing with Impure Test Stimulus for Multi-tone Test.
Proceedings of the IEEE International Test Conference in Asia, 2018

Transparent side channel trigger mechanism on analog circuits with PAAST hardware Trojans.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

A High Constancy Rail-to-rail Level Shift Generator for SEIR-based BIST circuit for ADCs.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

A Transient-Enhanced Fully-Integrated LDO Regulator for SoC Application.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

Concurrent Sampling with Local Digitization - An Alternative to Analog Test Bus.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

A low-cost jitter separation and ADC spectral testing method without requiring coherent sampling.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

Cost-effective accurate DAC-ADC co-testing and DAC linearization.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018

Low-cost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILE-ROME).
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018

2017
Accurate Spectral Testing With Arbitrary Noncoherency in Sampling and Simultaneous Drifts in Amplitude and Frequency.
IEEE Trans. Instrum. Meas., 2017

Algorithms for Accurate Spectral Analysis in the Presence of Arbitrary Noncoherency and Large Distortion.
IEEE Trans. Instrum. Meas., 2017

Accurate Spectral Testing With Non-Coherent Sampling for Multi-Tone Test.
IEEE Trans. Circuits Syst. II Express Briefs, 2017

Efficient Verification Against Undesired Operating Points for MOS Analog Circuits.
IEEE Trans. Circuits Syst. I Regul. Pap., 2017

ADC Spectral Testing with Signal Amplitude Drift and Simultaneous Non-coherent Sampling.
J. Electron. Test., 2017

A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm.
J. Electron. Test., 2017

Accurate jitter decomposition in high-speed links.
Proceedings of the 35th IEEE VLSI Test Symposium, 2017

A low-cost method for separation and accurate estimation of ADC noise, aperture jitter, and clock jitter.
Proceedings of the 35th IEEE VLSI Test Symposium, 2017

Technique for generating timing skew resistant time-interleaved signals.
Proceedings of the IEEE 60th International Midwest Symposium on Circuits and Systems, 2017

Practical linear and quadratic gradient errors suppression techniques in string DACs.
Proceedings of the IEEE 60th International Midwest Symposium on Circuits and Systems, 2017

Systematic and random mismatch characterization in device arrays.
Proceedings of the IEEE 60th International Midwest Symposium on Circuits and Systems, 2017

Accurate and robust spectral testing with relaxed instrumentation requirements.
Proceedings of the IEEE International Test Conference, 2017

Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter.
Proceedings of the IEEE International Test Conference, 2017

An on-chip ADC BIST solution and the BIST enabled calibration scheme.
Proceedings of the IEEE International Test Conference, 2017

Accurate spectral testing of the signals with amplitude drift.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017

A digital clock-less pulse stretcher with application in deep sub-nanosecond pulse detection.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017

A voltage reference generator targeted at extracting the silicon bandgap Vgo from Vbe.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017

2016
Accurate Spectral Testing With Impure Source and Noncoherent Sampling.
IEEE Trans. Instrum. Meas., 2016

New Strategies in Removing Noncoherency From Signals With Large Distortion-to-Noise Ratios.
IEEE Trans. Circuits Syst. II Express Briefs, 2016

Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise.
Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Accurate spectral testing with non-coherent sampling for large distortion to noise ratios.
Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Low cost ultra-pure sine wave generation with self calibration.
Proceedings of the 2016 IEEE International Test Conference, 2016

New strategies in removing non-coherency from signals with large distortion to noise ratios.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

Toward complete analog fault coverage with minimal observation points using a fault propagation graph.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

Low-cost dithering generator for accurate ADC linearity test.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

2015
Extracting random jitter and sinusoidal jitter in ADC output with a single frequency test.
IEICE Electron. Express, 2015

A Comparative Study of State-of-the-Art High-Performance Spectral Test Methods.
IEEE Des. Test, 2015

A low cost jitter separation and characterization method.
Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Ultrafast stimulus error removal algorithm for ADC linearity test.
Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Effect of flicker noise on SEIR for accurate ADC linearity testing.
Proceedings of the IEEE 58th International Midwest Symposium on Circuits and Systems, 2015

A simple ramp generator with level spreading for SEIR based ADC BIST circuit.
Proceedings of the IEEE 58th International Midwest Symposium on Circuits and Systems, 2015

Switched-compensation technique in switched-capacitor circuit for achieving fast settling performance.
Proceedings of the IEEE 58th International Midwest Symposium on Circuits and Systems, 2015

A hardware Trojan embedded in the Inverse Widlar reference generator.
Proceedings of the IEEE 58th International Midwest Symposium on Circuits and Systems, 2015

A slew-rate enhancement technique for fully differential amplifier without inducing Trojan state.
Proceedings of the IEEE 58th International Midwest Symposium on Circuits and Systems, 2015

A calibration technique for SAR analog-to-digital converter based on INL testing with quantization bits and redundant bit.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

Cascode and transconductance with capacitances feedback compensation for multistage amplifiers driving no load and 1nF capacitive load.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

An integrated circuit solution of thermal noise thermometer with cascaded pre-amplifier and 6-bit resolution analog-to-digital converter.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

A low cost jitter estimation and ADC spectral testing method.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

Accurate spectral testing of analog-to-digital converters with frequency drift using phase correction and averaging.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

Direct temperature to digital converters with low supply sensitivity for power/thermal management.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

A programmable temperature trigger circuit.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

A novel 20-bit R-2R DAC structure based on ordered element matching.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

High-constancy offset generator robust to CDAC nonlinearity for SEIR-based ADC BIST.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

Performance enhancement induced Trojan states in op-amps, their detection and removal.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

2014
Efficient Spectral Testing With Clipped and Noncoherently Sampled Data.
IEEE Trans. Instrum. Meas., 2014

Accurate and efficient method of jitter and noise separation and its application to ADC testing.
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Auto-identification of positive feedback loops in multi-state vulnerable circuits.
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Challenges and opportunities for determining presence of multiple equilibrium points with circuit simulators.
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

A CMOS supply-insensitive with 13ppm/°C temperature coefficient current reference.
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

A simple slew rate enhancement technique with improved linearity and preserved small signal performance.
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

An effective conductance cancellation method with minimal design effort.
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

Fast co-test of linearity and spectral performance with non-coherent sampled and amplitude clipped data.
Proceedings of the 2014 International Test Conference, 2014

Identification and break of positive feedback loops in Trojan States Vulnerable Circuits.
Proceedings of the IEEE International Symposium on Circuits and Systemss, 2014

Efficient analog verification against Trojan states using divide and contraction method.
Proceedings of the IEEE International Symposium on Circuits and Systemss, 2014

A high gain operational amplifier via an efficient conductance cancellation technique.
Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 2014

2013
FIRE: A Fundamental Identification and Replacement Method for Accurate Spectral Test Without Requiring Coherency.
IEEE Trans. Instrum. Meas., 2013

An Order-Statistics Based Matching Strategy for Circuit Components in Data Converters.
IEEE Trans. Circuits Syst. I Regul. Pap., 2013

Low-Distortion Sine Wave Generation Using a Novel Harmonic Cancellation Technique.
IEEE Trans. Circuits Syst. I Regul. Pap., 2013

Effectiveness of circuit-level continuation methods for Trojan State Elimination verification.
Proceedings of the IEEE 56th International Midwest Symposium on Circuits and Systems, 2013

Accurate full spectrum test robust to simultaneous non-coherent sampling and amplitude clipping.
Proceedings of the 2013 IEEE International Test Conference, 2013

Test time reduction with SATOM: Simultaneous AC-DC Test with Orthogonal Multi-excitations.
Proceedings of the 2013 IEEE International Test Conference, 2013

A CMOS on-chip temperature sensor with -0.21°C 0.17 °C inaccuracy from -20 °C to 100 °C.
Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013

Practical methods for verifying removal of Trojan stable operating points.
Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013

High resolution ADC spectral test with known impure source and non-coherent sampling.
Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013

Reliability degradation with electrical, thermal and thermal gradient stress in interconnects.
Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013

A high resolution and high accuracy R-2R DAC based on ordered element matching.
Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013

ADC spectral testing allowing amplitude clipping.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2013

A 15-bit binary-weighted current-steering DAC with ordered element matching.
Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013

2012
New Spectral Leakage-Removing Method for Spectral Testing of Approximate Sinusoidal Signals.
IEEE Trans. Instrum. Meas., 2012

Testing ADC Spectral Performance Without Dedicated Data Acquisition.
IEEE Trans. Instrum. Meas., 2012

ADC jitter estimation using a single frequency test without requiring coherent sampling.
IEICE Electron. Express, 2012

An Accurate and Cost-Effective Jitter Measurement Technique Using a Single Test Frequency.
J. Electron. Test., 2012

On Chip Signal Generators for Low Overhead ADC BIST.
J. Electron. Test., 2012

Performance verification of start-up circuits in reference generators.
Proceedings of the 55th IEEE International Midwest Symposium on Circuits and Systems, 2012

A method for accurate full spectrum testing without requiring coherency.
Proceedings of the 55th IEEE International Midwest Symposium on Circuits and Systems, 2012

An on-chip inductive impedance measurement method with adaptive measurement range control for MWM-array based NDE applications.
Proceedings of the 55th IEEE International Midwest Symposium on Circuits and Systems, 2012

Reliability modeling of metal interconnects with time-dependent electrical and thermal stress.
Proceedings of the 55th IEEE International Midwest Symposium on Circuits and Systems, 2012

Algorithm for dramatically improved efficiency in ADC linearity test.
Proceedings of the 2012 IEEE International Test Conference, 2012

A compact low-power supply-insensitive CMOS current reference.
Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012

Sinusoidal signal generation for production testing and BIST applications.
Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012

A low cost method for testing offset and gain error for ADC BIST.
Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012

2011
A novel robust and accurate spectral testing method for non-coherent sampling.
Proceedings of the 2011 IEEE International Test Conference, 2011

Linear vt-based temperature sensors with low process sensitivity and improved power supply headroom.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2011), 2011

SNR measurement based on linearity test for ADC BIST.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2011), 2011

2010
A new method for estimating spectral performance of ADC from INL.
Proceedings of the 2011 IEEE International Test Conference, 2010

Output impedance linearization technique for current-steering DACs.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

New calibration technique for current-steering DACs.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

Linearity testing of ADCs using low linearity stimulus and Kalman filtering.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

Detailed analyses in prediction of capacitive-mismatch-induced offset in dynamic comparators.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

INL based dynamic performance estimation for ADC BIST.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

Phase control of triangular stimulus generator for ADC BIST.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

2009
High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy.
IEEE Trans. Instrum. Meas., 2009

Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal.
IEEE Trans. Instrum. Meas., 2009

Analyses of Static and Dynamic Random Offset Voltages in Dynamic Comparators.
IEEE Trans. Circuits Syst. I Regul. Pap., 2009

Optimal Area and Impedance Allocation for Dual-string DACs.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2009), 2009

Cost Effective Signal Generators for ADC BIST.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2009), 2009

Signal generators for cost effective BIST of ADCs.
Proceedings of the 19th European Conference on Circuit Theory and Design, 2009

2008
Testing of Precision DAC Using Low-Resolution ADC With Wobbling.
IEEE Trans. Instrum. Meas., 2008

System identification -based reduced-code testing for pipeline ADCs' linearity test.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008

Adjustable hysteresis CMOS Schmitt triggers.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008

A simple and accurate method to predict offset voltage in dynamic comparators.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008

On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering.
Proceedings of the 2008 IEEE International Conference on Electro/Information Technology, 2008

An overview and behavioral modeling of higher order multi-bit SigmaDelta A/D converters.
Proceedings of the 2008 IEEE International Conference on Electro/Information Technology, 2008

2007
SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving.
IEEE Trans. Instrum. Meas., 2007

Testing High-Resolution ADCs With Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs.
IEEE Trans. Instrum. Meas., 2007

Robust High-Gain Amplifier Design Using Dynamical Systems and Bifurcation Theory With Digital Postprocessing Techniques.
IEEE Trans. Circuits Syst. I Regul. Pap., 2007

A fully digital-compatible BIST strategy for ADC linearity testing.
Proceedings of the 2007 IEEE International Test Conference, 2007

Deterministic DEM DAC Performance Analysis.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2007), 2007

2006
A deterministic dynamic element matching approach for testing high-resolution ADCs with low-accuracy excitations.
IEEE Trans. Instrum. Meas., 2006

Output tracking control of a one-link flexible manipulator via causal inversion.
IEEE Trans. Control. Syst. Technol., 2006

Yield enhancement with optimal area allocation for ratio-critical analog circuits.
IEEE Trans. Circuits Syst. I Regul. Pap., 2006

Testing of Precision DACs Using Low-Resolution ADCs with Dithering.
Proceedings of the 2006 IEEE International Test Conference, 2006

Linearity Test of Analog-to-Digital Converters Using Kalman Filtering.
Proceedings of the 2006 IEEE International Test Conference, 2006

Characterization of a current-mode bandgap circuit structure for high-precision reference applications.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

Linearity test for high resolution DACs using low-accuracy DDEM flash ADCs.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

Explicit characterization of bandgap references.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

A New High Precision Low Offset Dynamic Comparator for High Resolution High Speed ADCs.
Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems 2006, 2006

2005
Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal.
IEEE Trans. Instrum. Meas., 2005

A 16-bit resistor string DAC with full-calibration at final test.
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

High-performance ADC linearity test using low-precision signals in non-stationary environments.
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Pipeline ADC linearity testing with dramatically reduced data capture time.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

A two-step DDEM ADC for accurate and cost-effective DAC testing.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

A test strategy for time-to-digital converters using dynamic element matching and dithering.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

Dither incorporated deterministic dynamic element matching for high resolution ADC test using extremely low resolution DACs.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

An N<sup>th</sup> order central symmetrical layout pattern for nonlinear gradients cancellation.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

A cost-effective histogram test-based algorithm for digital calibration of high-precision pipelined ADCs.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

An adaptive, truly background calibration method for high speed pipeline ADC design.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

2004
A Computationally Efficient Method for Accurate Spectral Testing without Requiring Coherent Sampling.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Accurate testing of ADC's spectral performance using imprecise sinusoidal excitations.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

The SRE/SRM approach for spectral testing of AMS circuits.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

A novel 1.5 V CMFB CMOS down-conversion mixer design for IEEE 802.11 A WLAN systems.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

Parameter optimization of deterministic dynamic element matching DACs for accurate and cost-effective ADC testing.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

Testing high resolution ADCs using deterministic dynamic element matching.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

A background digital self-calibration scheme for pipelined ADCs based on transfer curve estimation.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

N<sup>TH</sup> order circular symmetry pattern and hexagonal tesselation: two new layout techniques cancelling nonlinear gradient.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

Robust design of high gain amplifiers using dynamical systems and bifurcation theory.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

Optimum area allocation for resistors and capacitors in continuous-time monolithic filters.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

2003
BIST and production testing of ADCs using imprecise stimulus.
ACM Trans. Design Autom. Electr. Syst., 2003

Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

1-D and 2-D switching strategies achieving near optimal INL for thermometer-coded current steering DACs.
Proceedings of the 2003 International Symposium on Circuits and Systems, 2003

Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance.
Proceedings of the 2003 International Symposium on Circuits and Systems, 2003

A deterministic dynamic element matching approach to ADC testing.
Proceedings of the 2003 International Symposium on Circuits and Systems, 2003

A low-voltage compatible two-stage amplifier with ≥120 dB gain in standard digital CMOS.
Proceedings of the 2003 International Symposium on Circuits and Systems, 2003

2001
Causal inversion of nonminimum phase systems.
Proceedings of the 40th IEEE Conference on Decision and Control, 2001

Automatic landing control using H<sub>∞</sub> control and stable inversion.
Proceedings of the 40th IEEE Conference on Decision and Control, 2001

2000
Adaptive learning control for nonminimum phase systems.
Proceedings of the IEEE International Conference on Systems, 2000

1999
Feedback control strategies for a nonholonomic mobile robot using a nonlinear oscillator.
J. Field Robotics, 1999

1998
A finite energy property of stable inversion to nonminimum phase nonlinear systems.
IEEE Trans. Autom. Control., 1998

1996
Nonlinear inversion-based output tracking.
IEEE Trans. Autom. Control., 1996

Optimal motion planning for flexible space robots.
Proceedings of the 1996 IEEE International Conference on Robotics and Automation, 1996

1993
Control of free-flying underactuated space manipulators to equilibrium manifolds.
IEEE Trans. Robotics Autom., 1993

Application of Kharitonov's theorem to mechanical systems.
IEEE Trans. Autom. Control., 1993

Adaptive linearization of hybrid step motors: stability analysis.
IEEE Trans. Autom. Control., 1993


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