Degang Chen
Affiliations: Iowa State University, Department of Electrical and Computer Engineering, Ames, IA, USA
 University of California, Santa Barbara, CA, USA (PhD 1992)
According to our database^{1},
Degang Chen
authored at least 223 papers
between 1993 and 2023.
Collaborative distances:
Collaborative distances:
Awards
IEEE Fellow
IEEE Fellow 2016, "For contributions to testing of analog and mixedsignal integrated circuits".
Timeline
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Online presence:

on orcid.org
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Bibliography
2023
SitetoSite Variation in Analog Multisite Testing: A Survey on Its Detection and Correction.
IEEE Des. Test, October, 2023
A WeightedBin Difference Method for Issue Site Identification in Analog and MixedSignal MultiSite Testing.
J. Electron. Test., February, 2023
Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023
UltraSmall Area, Highly Linear SubRadix R2R DigitalToAnalog Converters with Novel Calibration Algorithm.
Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023
Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023
Small Area, High Accuracy SubRadix Resistive Current Mode DigitalToAnalog Converter with Novel Calibration Algorithm.
Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023
Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023
An Improved SingleTemperature Trim Technique for 1<sup>st</sup> OrderCompensated Bandgap References.
Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023
Proceedings of the IEEE International Symposium on Circuits and Systems, 2023
A Resistorless Precision CurvatureCompensated Bandgap Voltage Reference Based on the VGO Extraction Technique.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2023
A Power Supply Rejection Based Approach for Robust Defect Detection in Operational Amplifiers.
Proceedings of the IEEE EastWest Design & Test Symposium, 2023
Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved TimeEfficiency.
Proceedings of the IEEE EastWest Design & Test Symposium, 2023
Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview.
Proceedings of the IEEE EastWest Design & Test Symposium, 2023
Systematic Methodology to Design High Precision Voltage References with Subppm/°C Temperature Coefficient.
Proceedings of the IEEE EastWest Design & Test Symposium, 2023
2022
A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor MultiSite Testing.
J. Electron. Test., December, 2022
All Digital LowOverhead SAR ADC BuiltIn SelfTest for Fault Detection and Diagnosis.
Proceedings of the 40th IEEE VLSI Test Symposium, 2022
The LeastSquares Approach to Systematic Error Identification and Calibration in Semiconductor Multisite Testing.
Proceedings of the 40th IEEE VLSI Test Symposium, 2022
Digital DefectOriented Test Methodology for Flipped Voltage Follower Low Dropout (LDO) Voltage Regulators.
Proceedings of the 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2022
A TimeEfficient Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits.
Proceedings of the 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2022
Optimal Order Polynomial Transformation for Calibrating Systematic Errors in Multisite Testing.
Proceedings of the IEEE International Test Conference, 2022
Proceedings of the IEEE International Test Conference, 2022
Robust Builtin DefectDetection for Low DropOut Regulators using Digital Mismatch Injection.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022
A WideRange Lowcost Temperature to Digital Converter Independent of Device Models.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022
All Digital LowCost Builtin Defect Testing Strategy for Operational Amplifiers with High Coverage.
Proceedings of the 28th IEEE International Symposium on OnLine Testing and Robust System Design, 2022
Proceedings of the IEEE European Test Symposium, 2022
CrossCorrelation Approach to Detecting Issue Test Sites in Massive Parallel Testing.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022
2021
Detection of Site to Site Variations From Volume Measurement Data in Multisite Semiconductor Testing.
IEEE Trans. Instrum. Meas., 2021
IEEE Trans. Circuits Syst. II Express Briefs, 2021
Subppm/°C Bandgap References With Natural Basis Expansion for Curvature Cancellation.
IEEE Trans. Circuits Syst. I Regul. Pap., 2021
Proceedings of the 64th IEEE International Midwest Symposium on Circuits and Systems, 2021
Systematic Hardware Error Identification and Calibration for Massive Multisite Testing.
Proceedings of the IEEE International Test Conference, 2021
An Ordinal OptimizationBased Approach To Die Distribution Estimation For Massive Multisite Testing Validation: A Case Study.
Proceedings of the 26th IEEE European Test Symposium, 2021
Massive Multisite VariabilityAware Die Distribution Estimation for Analog/MixedSignal Circuits Test Validation.
Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021
2020
MIRE: A Multitone Identification and Replacement Method for Multitone Spectral Test Without Requiring Coherent Sampling.
IEEE Trans. Instrum. Meas., 2020
IEEE Trans. Instrum. Meas., 2020
IEEE Trans. Instrum. Meas., 2020
A 12Bit 125MS/s 2.5Bit/Cycle SARBased Pipeline ADC Employing a SelfBiased Gain Boosting Amplifier.
IEEE Trans. Circuits Syst., 2020
An 8bit LowCost String DAC With Gradient Errors Suppression to Achieve 16bit Linearity.
IEEE Trans. Circuits Syst. I Regul. Pap., 2020
A TransientEnhanced OutputCapacitorless LDO With Fast Local Loop and Overshoot Detection.
IEEE Trans. Circuits Syst., 2020
Quantile  Quantile Fitting Approach to Detect Site to Site Variations in Massive Multisite Testing.
Proceedings of the 38th IEEE VLSI Test Symposium, 2020
Proceedings of the 63rd IEEE International Midwest Symposium on Circuits and Systems, 2020
Proceedings of the 63rd IEEE International Midwest Symposium on Circuits and Systems, 2020
Robust DfT Techniques for Builtin Fault Detection in Operational Amplifiers with High Coverage.
Proceedings of the IEEE International Test Conference, 2020
A LowPower and AreaEfficient Analog Duty Cycle Corrector for ADC's External Clocks.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2020
A Simple Bandgap Reference Based on VGO Extraction with SingleTemperature Trimming.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2020
2019
IEEE Trans. Circuits Syst. I Regul. Pap., 2019
An Accurate and Efficient Method for Eliminating the Requirement of Coherent Sampling in MultiTone Test.
Proceedings of the 37th IEEE VLSI Test Symposium, 2019
Proceedings of the 62nd IEEE International Midwest Symposium on Circuits and Systems, 2019
Proceedings of the IEEE International Test Conference, 2019
Bandgap Voltage VGO Extraction with TwoTemperature Trimming for Designing Subppm/°C Voltage References.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2019
2018
HighPurity Sine Wave Generation Using Nonlinear DAC With Predistortion Based on LowCost Accurate DACADC CoTesting.
IEEE Trans. Instrum. Meas., 2018
IEEE Trans. Circuits Syst. I Regul. Pap., 2018
USERSMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Builtin SelfTest.
IEEE Trans. Circuits Syst. I Regul. Pap., 2018
Fast and accurate linearity test for DACs with various architectures using segmented models.
Proceedings of the IEEE International Test Conference, 2018
Proceedings of the IEEE International Test Conference in Asia, 2018
Proceedings of the IEEE International Test Conference in Asia, 2018
Transparent side channel trigger mechanism on analog circuits with PAAST hardware Trojans.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018
A High Constancy Railtorail Level Shift Generator for SEIRbased BIST circuit for ADCs.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018
A lowcost jitter separation and ADC spectral testing method without requiring coherent sampling.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2018
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018
Lowcost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILEROME).
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2018
2017
Accurate Spectral Testing With Arbitrary Noncoherency in Sampling and Simultaneous Drifts in Amplitude and Frequency.
IEEE Trans. Instrum. Meas., 2017
Algorithms for Accurate Spectral Analysis in the Presence of Arbitrary Noncoherency and Large Distortion.
IEEE Trans. Instrum. Meas., 2017
IEEE Trans. Circuits Syst. II Express Briefs, 2017
Efficient Verification Against Undesired Operating Points for MOS Analog Circuits.
IEEE Trans. Circuits Syst. I Regul. Pap., 2017
ADC Spectral Testing with Signal Amplitude Drift and Simultaneous Noncoherent Sampling.
J. Electron. Test., 2017
A Lowcost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm.
J. Electron. Test., 2017
Proceedings of the 35th IEEE VLSI Test Symposium, 2017
A lowcost method for separation and accurate estimation of ADC noise, aperture jitter, and clock jitter.
Proceedings of the 35th IEEE VLSI Test Symposium, 2017
Proceedings of the IEEE 60th International Midwest Symposium on Circuits and Systems, 2017
Practical linear and quadratic gradient errors suppression techniques in string DACs.
Proceedings of the IEEE 60th International Midwest Symposium on Circuits and Systems, 2017
Proceedings of the IEEE 60th International Midwest Symposium on Circuits and Systems, 2017
Proceedings of the IEEE International Test Conference, 2017
Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter.
Proceedings of the IEEE International Test Conference, 2017
Proceedings of the IEEE International Test Conference, 2017
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017
A digital clockless pulse stretcher with application in deep subnanosecond pulse detection.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017
A voltage reference generator targeted at extracting the silicon bandgap Vgo from Vbe.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017
2016
IEEE Trans. Instrum. Meas., 2016
New Strategies in Removing Noncoherency From Signals With Large DistortiontoNoise Ratios.
IEEE Trans. Circuits Syst. II Express Briefs, 2016
Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise.
Proceedings of the 34th IEEE VLSI Test Symposium, 2016
Accurate spectral testing with noncoherent sampling for large distortion to noise ratios.
Proceedings of the 34th IEEE VLSI Test Symposium, 2016
Proceedings of the 2016 IEEE International Test Conference, 2016
New strategies in removing noncoherency from signals with large distortion to noise ratios.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016
Toward complete analog fault coverage with minimal observation points using a fault propagation graph.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016
2015
Extracting random jitter and sinusoidal jitter in ADC output with a single frequency test.
IEICE Electron. Express, 2015
IEEE Des. Test, 2015
Proceedings of the 33rd IEEE VLSI Test Symposium, 2015
Proceedings of the 33rd IEEE VLSI Test Symposium, 2015
Proceedings of the IEEE 58th International Midwest Symposium on Circuits and Systems, 2015
Proceedings of the IEEE 58th International Midwest Symposium on Circuits and Systems, 2015
Switchedcompensation technique in switchedcapacitor circuit for achieving fast settling performance.
Proceedings of the IEEE 58th International Midwest Symposium on Circuits and Systems, 2015
Proceedings of the IEEE 58th International Midwest Symposium on Circuits and Systems, 2015
A slewrate enhancement technique for fully differential amplifier without inducing Trojan state.
Proceedings of the IEEE 58th International Midwest Symposium on Circuits and Systems, 2015
A calibration technique for SAR analogtodigital converter based on INL testing with quantization bits and redundant bit.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015
Cascode and transconductance with capacitances feedback compensation for multistage amplifiers driving no load and 1nF capacitive load.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015
An integrated circuit solution of thermal noise thermometer with cascaded preamplifier and 6bit resolution analogtodigital converter.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015
Accurate spectral testing of analogtodigital converters with frequency drift using phase correction and averaging.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015
Direct temperature to digital converters with low supply sensitivity for power/thermal management.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015
Highconstancy offset generator robust to CDAC nonlinearity for SEIRbased ADC BIST.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015
Performance enhancement induced Trojan states in opamps, their detection and removal.
Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015
2014
IEEE Trans. Instrum. Meas., 2014
Accurate and efficient method of jitter and noise separation and its application to ADC testing.
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014
Autoidentification of positive feedback loops in multistate vulnerable circuits.
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014
Challenges and opportunities for determining presence of multiple equilibrium points with circuit simulators.
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014
A CMOS supplyinsensitive with 13ppm/°C temperature coefficient current reference.
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014
A simple slew rate enhancement technique with improved linearity and preserved small signal performance.
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014
Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014
Fast cotest of linearity and spectral performance with noncoherent sampled and amplitude clipped data.
Proceedings of the 2014 International Test Conference, 2014
Identification and break of positive feedback loops in Trojan States Vulnerable Circuits.
Proceedings of the IEEE International Symposium on Circuits and Systemss, 2014
Efficient analog verification against Trojan states using divide and contraction method.
Proceedings of the IEEE International Symposium on Circuits and Systemss, 2014
A high gain operational amplifier via an efficient conductance cancellation technique.
Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, 2014
2013
FIRE: A Fundamental Identification and Replacement Method for Accurate Spectral Test Without Requiring Coherency.
IEEE Trans. Instrum. Meas., 2013
An OrderStatistics Based Matching Strategy for Circuit Components in Data Converters.
IEEE Trans. Circuits Syst. I Regul. Pap., 2013
LowDistortion Sine Wave Generation Using a Novel Harmonic Cancellation Technique.
IEEE Trans. Circuits Syst. I Regul. Pap., 2013
Effectiveness of circuitlevel continuation methods for Trojan State Elimination verification.
Proceedings of the IEEE 56th International Midwest Symposium on Circuits and Systems, 2013
Accurate full spectrum test robust to simultaneous noncoherent sampling and amplitude clipping.
Proceedings of the 2013 IEEE International Test Conference, 2013
Test time reduction with SATOM: Simultaneous ACDC Test with Orthogonal Multiexcitations.
Proceedings of the 2013 IEEE International Test Conference, 2013
A CMOS onchip temperature sensor with 0.21°C 0.17 °C inaccuracy from 20 °C to 100 °C.
Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013
Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013
High resolution ADC spectral test with known impure source and noncoherent sampling.
Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013
Reliability degradation with electrical, thermal and thermal gradient stress in interconnects.
Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013
Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2013
Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013
2012
New Spectral LeakageRemoving Method for Spectral Testing of Approximate Sinusoidal Signals.
IEEE Trans. Instrum. Meas., 2012
IEEE Trans. Instrum. Meas., 2012
ADC jitter estimation using a single frequency test without requiring coherent sampling.
IEICE Electron. Express, 2012
An Accurate and CostEffective Jitter Measurement Technique Using a Single Test Frequency.
J. Electron. Test., 2012
J. Electron. Test., 2012
Proceedings of the 55th IEEE International Midwest Symposium on Circuits and Systems, 2012
Proceedings of the 55th IEEE International Midwest Symposium on Circuits and Systems, 2012
An onchip inductive impedance measurement method with adaptive measurement range control for MWMarray based NDE applications.
Proceedings of the 55th IEEE International Midwest Symposium on Circuits and Systems, 2012
Reliability modeling of metal interconnects with timedependent electrical and thermal stress.
Proceedings of the 55th IEEE International Midwest Symposium on Circuits and Systems, 2012
Proceedings of the 2012 IEEE International Test Conference, 2012
Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012
Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012
Proceedings of the 2012 IEEE International Symposium on Circuits and Systems, 2012
2011
Proceedings of the 2011 IEEE International Test Conference, 2011
Linear vtbased temperature sensors with low process sensitivity and improved power supply headroom.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2011), 2011
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2011), 2011
2010
Proceedings of the 2011 IEEE International Test Conference, 2010
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010
Detailed analyses in prediction of capacitivemismatchinduced offset in dynamic comparators.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010
2009
HighResolution ADC Linearity Testing Using a Fully DigitalCompatible BIST Strategy.
IEEE Trans. Instrum. Meas., 2009
CodeDensity Test of AnalogtoDigital Converters Using Single LowLinearity Stimulus Signal.
IEEE Trans. Instrum. Meas., 2009
IEEE Trans. Circuits Syst. I Regul. Pap., 2009
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2009), 2009
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2009), 2009
Proceedings of the 19th European Conference on Circuit Theory and Design, 2009
2008
IEEE Trans. Instrum. Meas., 2008
System identification based reducedcode testing for pipeline ADCs' linearity test.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008
Onchip atspeed linearity testing of highresolution highspeed DACs using DDEM ADCs with dithering.
Proceedings of the 2008 IEEE International Conference on Electro/Information Technology, 2008
An overview and behavioral modeling of higher order multibit SigmaDelta A/D converters.
Proceedings of the 2008 IEEE International Conference on Electro/Information Technology, 2008
2007
SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With CenterSymmetric Interleaving.
IEEE Trans. Instrum. Meas., 2007
Testing HighResolution ADCs With LowResolution/Accuracy Deterministic Dynamic Element Matched DACs.
IEEE Trans. Instrum. Meas., 2007
Robust HighGain Amplifier Design Using Dynamical Systems and Bifurcation Theory With Digital Postprocessing Techniques.
IEEE Trans. Circuits Syst. I Regul. Pap., 2007
Proceedings of the 2007 IEEE International Test Conference, 2007
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2007), 2007
2006
A deterministic dynamic element matching approach for testing highresolution ADCs with lowaccuracy excitations.
IEEE Trans. Instrum. Meas., 2006
IEEE Trans. Control. Syst. Technol., 2006
Yield enhancement with optimal area allocation for ratiocritical analog circuits.
IEEE Trans. Circuits Syst. I Regul. Pap., 2006
Proceedings of the 2006 IEEE International Test Conference, 2006
Proceedings of the 2006 IEEE International Test Conference, 2006
Characterization of a currentmode bandgap circuit structure for highprecision reference applications.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006
A selfcalibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006
A New High Precision Low Offset Dynamic Comparator for High Resolution High Speed ADCs.
Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems 2006, 2006
2005
Accurate testing of analogtodigital converters using low linearity signals with stimulus error identification and removal.
IEEE Trans. Instrum. Meas., 2005
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
Highperformance ADC linearity test using lowprecision signals in nonstationary environments.
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005
A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005
A test strategy for timetodigital converters using dynamic element matching and dithering.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005
A digital selfcalibration algorithm for ADCs based on histogram test using lowlinearity input signals.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005
Dither incorporated deterministic dynamic element matching for high resolution ADC test using extremely low resolution DACs.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005
An N<sup>th</sup> order central symmetrical layout pattern for nonlinear gradients cancellation.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005
A costeffective histogram testbased algorithm for digital calibration of highprecision pipelined ADCs.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005
An adaptive, truly background calibration method for high speed pipeline ADC design.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005
2004
A Computationally Efficient Method for Accurate Spectral Testing without Requiring Coherent Sampling.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004
Accurate testing of ADC's spectral performance using imprecise sinusoidal excitations.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004
The SRE/SRM approach for spectral testing of AMS circuits.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004
A novel 1.5 V CMFB CMOS downconversion mixer design for IEEE 802.11 A WLAN systems.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004
Parameter optimization of deterministic dynamic element matching DACs for accurate and costeffective ADC testing.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004
Fast implementation of a linearity test approach for highresolution ADCs using nonlinear ramp signals.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004
An SoC compatible linearity test approach for precision ADCs using easytogenerate sinusoidal stimuli.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004
A background digital selfcalibration scheme for pipelined ADCs based on transfer curve estimation.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004
N<sup>TH</sup> order circular symmetry pattern and hexagonal tesselation: two new layout techniques cancelling nonlinear gradient.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004
Robust design of high gain amplifiers using dynamical systems and bifurcation theory.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004
Optimum area allocation for resistors and capacitors in continuoustime monolithic filters.
Proceedings of the 2004 International Symposium on Circuits and Systems, 2004
2003
ACM Trans. Design Autom. Electr. Syst., 2003
Linearity Testing of Precision AnalogtoDigital Converters Using Stationary Nonlinear Inputs.
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003
1D and 2D switching strategies achieving near optimal INL for thermometercoded current steering DACs.
Proceedings of the 2003 International Symposium on Circuits and Systems, 2003
Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance.
Proceedings of the 2003 International Symposium on Circuits and Systems, 2003
Proceedings of the 2003 International Symposium on Circuits and Systems, 2003
A lowvoltage compatible twostage amplifier with ≥120 dB gain in standard digital CMOS.
Proceedings of the 2003 International Symposium on Circuits and Systems, 2003
2001
Proceedings of the 40th IEEE Conference on Decision and Control, 2001
Proceedings of the 40th IEEE Conference on Decision and Control, 2001
2000
Proceedings of the IEEE International Conference on Systems, 2000
1999
Feedback control strategies for a nonholonomic mobile robot using a nonlinear oscillator.
J. Field Robotics, 1999
1998
A finite energy property of stable inversion to nonminimum phase nonlinear systems.
IEEE Trans. Autom. Control., 1998
1996
IEEE Trans. Autom. Control., 1996
Proceedings of the 1996 IEEE International Conference on Robotics and Automation, 1996
1993
IEEE Trans. Robotics Autom., 1993
IEEE Trans. Autom. Control., 1993
IEEE Trans. Autom. Control., 1993