Marcelo Negreiros

According to our database, Marcelo Negreiros authored at least 29 papers between 1998 and 2017.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2017

Monocular Visual Odometry with Cyclic Estimation.

Fábio Irigon Pereira, Gustavo Ilha, Joel Luft, Marcelo Negreiros, Altamiro Amadeu Susin

Proceedings of the 30th SIBGRAPI Conference on Graphics, Patterns and Images, 2017

2014

Adaptive Shared Memory Control for Multimedia Systems-on-Chip.

Alexsandro Cristovão Bonatto, Marcelo Negreiros, Fábio I. Pereira, André Borin Soares, Altamiro Amadeu Susin

Proceedings of the 27th Symposium on Integrated Circuits and Systems Design, 2014

H.264 8x8 inverse transform architecture optimization.

Fábio I. Pereira, André Borin Soarez, Altamiro Amadeu Susin, Alexsandro Cristovão Bonatto, Marcelo Negreiros

Proceedings of the Great Lakes Symposium on VLSI 2014, GLSVLSI '14, Houston, TX, USA - May 21, 2014

2012

Towards an Efficient Memory Architecture for Video Decoding Systems.

Alexsandro Cristovão Bonatto, Marcelo Negreiros, André Borin Soares, Altamiro Amadeu Susin

Proceedings of the 2012 Brazilian Symposium on Computing System Engineering, 2012

2007

Reducing Test Time Using an Enhanced RF Loopback.

Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin

J. Electron. Test., 2007

RF Digital Signal Generation Beyond Nyquist.

Marcelo Negreiros, Adão Antônio de Souza Jr., Luigi Carro, Altamiro Amadeu Susin

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

A Digitally Testable Capacitance-Insensitive Mixed-Signal Filter.

Erik Schüler, Marcelo Negreiros, Pascal Nouet, Luigi Carro

Proceedings of the 12th European Test Symposium, 2007

Digital Generation of Signals for Low Cost RF BIST.

Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin

Proceedings of the 12th European Test Symposium, 2007

2006

An improved RF loopback for test time reduction.

Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin

Proceedings of the Conference on Design, Automation and Test in Europe, 2006

2005

Low Cost On-Line Testing Strategy for RF Circuits.

Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin

J. Electron. Test., 2005

Low Cost BIST for Static and Dynamic Testing of ADCs.

Maria Da Gloria Flores, Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin, Felipe R. Clayton, Cristiano Benevento

J. Electron. Test., 2005

Noise Figure Evaluation Using Low Cost BIST.

Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin

Proceedings of the 2005 Design, 2005

2004

INL and DNL estimation based on noise for ADC test.

Maria Da Gloria Flores, Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin

IEEE Trans. Instrum. Meas., 2004

Low Cost On-Line Testing of RF Circuits.

Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin

Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004

Towards a BIST technique for noise figure evaluation.

Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin

Proceedings of the 9th European Test Symposium, 2004

Low Cost Analog Testing of RF Signal Paths.

Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin

Proceedings of the 2004 Design, 2004

2003

Testing analog circuits using spectral analysis.

Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin

Microelectron. J., 2003

Circuit-Level Considerations for Mixed-Signal Programmable Components.

Luigi Carro, Marcelo Negreiros, Gabriel Parmegiani Jahn, Adão Antônio de Souza Jr., Denis Teixeira Franco

IEEE Des. Test Comput., 2003

Ultra Low Cost Analog BIST Using Spectral Analysis.

Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

Testing RF Signal Paths Using Spectral Analysis and Subsampling.

Marcelo Negreiros, Erik Schüler, Luigi Carro, Altamiro Amadeu Susin

Proceedings of the 16th Annual Symposium on Integrated Circuits and Systems Design, 2003

Ultimate low cost analog BIST.

Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin

Proceedings of the 40th Design Automation Conference, 2003

2002

Analysis and Implementation of a Stochastic Multiplier for Electrical Power Measurement.

André Borin Soares, Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin

Proceedings of the 15th Annual Symposium on Integrated Circuits and Systems Design, 2002

A Statistical Sampler for Increasing Analog Circuits Observability.

Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin

Proceedings of the 15th Annual Symposium on Integrated Circuits and Systems Design, 2002

A Noise Generator for Analog-to-Digital Converter Testing.

M. G. C. Flores, Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin

Proceedings of the 15th Annual Symposium on Integrated Circuits and Systems Design, 2002

Complex Adaptive Signal Processing for Analog Testing.

Adão Antonio de Souza Junior, Marcelo Negreiros, Luigi Carro, Altamiro A. Suzim

Proceedings of the 3rd Latin American Test Workshop, 2002

A Statistical Sampler for a New On-line Analog Test Method.

Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin

Proceedings of the 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 2002

2000

A new adaptive analog test and diagnosis system.

Érika F. Cota, Marcelo Negreiros, Luigi Carro, Marcelo Lubaszewski

IEEE Trans. Instrum. Meas., 2000

Non-Linear Components for Mixed Circuits Analog Front-End.

Luigi Carro, Adão Antônio de Souza Jr., Marcelo Negreiros, Gabriel Parmegiani Jahn, Denis Teixeira Franco

Proceedings of the 2000 Design, 2000

1998

Efficient Analog Test Methodology Based on Adaptive Algorithms.

Luigi Carro, Marcelo Negreiros

Proceedings of the 35th Conference on Design Automation, 1998