Marcelo Lubaszewski

According to our database, Marcelo Lubaszewski authored at least 133 papers between 1992 and 2023.

Collaborative distances:

• Dijkstra number of three.
• Erdős number of three.

2023

Towards a Machine Learning Based Method for Indirect Test Generation of Mixed-Signal Circuits.

Állan G. Ferreira, Lucas B. Zilch, Vinícius Navarro, Marcelo Soares Lubaszewski, Tiago R. Balen

Proceedings of the 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2023

2022

Evaluating Fault Coverage of Structural and Specification-based Tests Obtained With a Low-Cost Analog TPG Tool.

Lucas B. Zilch, Állan G. Ferreira, Marcelo Soares Lubaszewski, Tiago R. Balen

Proceedings of the 23rd IEEE Latin American Test Symposium, 2022

2020

A Highly Reliable Wearable Device for Fall Detection.

João Carlos Britto Filho, Marcelo Lubaszewski

Proceedings of the IEEE Latin-American Test Symposium, 2020

2016

Successful prototyping of complex integrated circuits with focused ion beam.

E. Petitprez, Dalton M. Colombo, Felipe M. Henes, Laurent Courcelle, R. Tararam, S. Jacobsen, R. Soares, C. Krug, Marcelo Lubaszewski

Proceedings of the 29th Symposium on Integrated Circuits and Systems Design, 2016

2015

Exploring design diversity redundancy to improve resilience in mixed-signal systems.

Cristiano P. Chenet, Lucas A. Tambara, Gabriel de M. Borges, Fernanda Lima Kastensmidt, Marcelo Soares Lubaszewski, Tiago R. Balen

Microelectron. Reliab., 2015

Low power, high-sensitivity clock recovery circuit for LF/HF RFID applications.

Rafael Cantalice, Alexandre Simionovski, Fernando Paixão Cortes, Marcelo Lubaszewski

Proceedings of the 28th Symposium on Integrated Circuits and Systems Design, 2015

A low-power RFID enabled temperature sensor for cold chain management.

Francisco O. O. Gomes, Luciano de Paula, Joao C. S. Santos, Laurent Courcelle, Daniel Piovani, Filipe Viera, Felipe M. Henes, Marcelo Lubaszewski

Proceedings of the 2015 IEEE International Symposium on Circuits and Systems, 2015

2014

A 2-Transistor Sub-1V Low Power Temperature Compensated CMOS Voltage Reference.

Alfredo Olmos, Juan Pablo Martinez Brito, Fabrício Jorge Antunes Ferreira, Fernando Chávez, Marcelo Soares Lubaszewski

Proceedings of the 27th Symposium on Integrated Circuits and Systems Design, 2014

A low-power RF/analog front-end architecture for LF passive RFID tags with dynamic power sensing.

Fernando Paixão Cortes, Juan Pablo Martinez Brito, Rafael Cantalice, Everton Ghignatti, Alfredo Olmos, Fernando Chávez, Marcelo Lubaszewski

Proceedings of the IEEE International Conference on RFID, 2014

A power management system architecture for LF passive RFID tags.

Fernando da Rocha Paixão Cortes, Juan Pablo Martinez Brito, Everton Ghignatti, Alfredo Olmos, Fernando Chávez, Marcelo Lubaszewski

Proceedings of the IEEE 5th Latin American Symposium on Circuits and Systems, 2014

2013

Neutron-induced single event effects analysis in a SAR-ADC architecture embedded in a mixed-signal SoC.

Lucas A. Tambara, Fernanda Lima Kastensmidt, Paolo Rech, Tiago R. Balen, Marcelo Lubaszewski

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2013

Determining the test sources/sinks for NoC TAMs.

Alexandre M. Amory, Edson I. Moreno, Fernando Moraes, Marcelo Lubaszewski

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2013

Evaluating the scalability of test buses.

Alexandre M. Amory, Matheus T. Moreira, Ney Laert Vilar Calazans, Fernando Gehm Moraes, Cristiano Lazzari, Marcelo Soares Lubaszewski

Proceedings of the 2013 International Symposium on System on Chip, 2013

2012

Impact of TID-induced threshold deviations in analog building-blocks of operational amplifiers.

Guilherme Schwanke Cardoso, Tiago R. Balen, Marcelo Soares Lubaszewski, Rafael Galhardo Vaz, Odair Lelis Goncalez

Proceedings of the 13th Latin American Test Workshop, 2012

Low pin count DfT technique for RFID ICs.

Marcelo de Souza Moraes, Marcos Barcellos Hervé, Marcelo Lubaszewski

Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012

2011

Contributions to the evaluation of ensembles of combinational logic gates.

Renato P. Ribas, Simone Bavaresco, N. Schuch, Vinicius Callegaro, Marcelo Lubaszewski, André Inácio Reis

Microelectron. J., 2011

Improving the yield of NoC-based systems through fault diagnosis and adaptive routing.

Caroline Concatto, João Almeida, Guilherme Fachini, Marcos Hervé, Fernanda Lima Kastensmidt, Érika F. Cota, Marcelo Lubaszewski

J. Parallel Distributed Comput., 2011

A new test scheduling algorithm based on Networks-on-Chip as Test Access Mechanisms.

Alexandre M. Amory, Cristiano Lazzari, Marcelo Lubaszewski, Fernando Gehm Moraes

J. Parallel Distributed Comput., 2011

Functional Test of Mesh-Based NoCs with Deterministic Routing: Integrating the Test of Interconnects and Routers.

Marcos Barcellos Hervé, Marcelo de Souza Moraes, Pedro Almeida, Marcelo Lubaszewski, Fernanda Lima Kastensmidt, Érika F. Cota

J. Electron. Test., 2011

Fault Detection, Diagnosis and Prediction in Electrical Valves Using Self-Organizing Maps.

Luiz Fernando Gonçalves, Jefferson Luiz Bosa, Tiago Roberto Balen, Marcelo Lubaszewski, Eduardo Luis Schneider, Renato V. B. Henriques

J. Electron. Test., 2011

Early estimation of wire length for dedicated test access mechanisms in networks-on-chip based SoCs.

Alexandre M. Amory, Cristiano Lazzari, Marcelo Lubaszewski, Fernando Gehm Moraes

Proceedings of the 24th Symposium on Integrated Circuits and Systems Design, 2011

Task mapping on NoC-based MPSoCs with faulty tiles: Evaluating the energy consumption and the application execution time.

Alexandre M. Amory, César A. M. Marcon, Fernando Gehm Moraes, Marcelo Lubaszewski

Proceedings of the 22nd IEEE International Symposium on Rapid System Prototyping, 2011

Investigating the effects of transient faults in Programmable Capacitor Arrays.

Tiago R. Balen, Guilherme Schwanke Cardoso, Odair Lelis Gonçalez, Marcelo Soares Lubaszewski

Proceedings of the 12th Latin American Test Workshop, 2011

Evaluating energy consumption of homogeneous MPSoCs using spare tiles.

Alexandre M. Amory, Luciano Ost, César A. M. Marcon, Fernando Gehm Moraes, Marcelo Lubaszewski

Proceedings of the Design, Automation and Test in Europe, 2011

2010

Special session 12B: Embedded tutorial test and fault tolerance of networks-on-chip.

Marcelo Lubaszewski, Érika F. Cota

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

A broad strategy to detect crosstalk faults in network-on-chip interconnects.

Mariza Botelho, Fernanda Lima Kastensmidt, Marcelo Lubaszewski, Érika F. Cota, Luigi Carro

Proceedings of the 18th IEEE/IFIP VLSI-SoC 2010, 2010

Evaluating the effectiveness of a mixed-signal TMR scheme based on design diversity.

Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski

Proceedings of the 23rd Annual Symposium on Integrated Circuits and Systems Design, 2010

Concurrent test of Network-on-Chip interconnects and routers.

Marcos Hervé, Pedro Almeida, Fernanda Lima Kastensmidt, Érika F. Cota, Marcelo Lubaszewski

Proceedings of the 11th Latin American Test Workshop, 2010

Fault prediction in electrical valves using temporal Kohonen maps.

Luiz Fernando Gonçalves, Eduardo Luis Schneider, Renato Ventura Bayan Henriques, Marcelo Lubaszewski, Jefferson Luiz Bosa, Paulo Martins Engel

Proceedings of the 11th Latin American Test Workshop, 2010

Diversity TMR: Proof of concept in a mixed-signal case.

Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski

Proceedings of the 11th Latin American Test Workshop, 2010

Efficiently using data splitting and retransmission to tolerate faults in networks-on-chip interconnects.

Matheus Braga, Érika F. Cota, Fernanda Lima Kastensmidt, Marcelo Lubaszewski

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

Radiation effects on programmable analog devices and mitigation techniques.

Tiago R. Balen, Marcelo Lubaszewski

Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010

Increasing reliability of programmable mixed-signal systems by applying design diversity redundancy.

Gabriel de M. Borges, Luiz Fernando Gonçalves, Tiago R. Balen, Marcelo Lubaszewski

Proceedings of the 15th European Test Symposium, 2010

2009

Design of an embedded system for the proactive maintenance of electrical valves.

Luiz Fernando Gonçalves, Jefferson Luiz Bosa, Renato V. B. Henriques, Marcelo Lubaszewski

Proceedings of the 22st Annual Symposium on Integrated Circuits and Systems Design: Chip on the Dunes, 2009

Resource-and-time-aware test strategy for configurable quaternary logic blocks.

Érika F. Cota, Luigi Carro, Felipe Pinto, Ricardo Augusto da Luz Reis, Marcelo Lubaszewski

Proceedings of the 22st Annual Symposium on Integrated Circuits and Systems Design: Chip on the Dunes, 2009

Diagnosis of interconnect shorts in mesh NoCs.

Marcos Hervé, Érika F. Cota, Fernanda Lima Kastensmidt, Marcelo Lubaszewski

Proceedings of the Third International Symposium on Networks-on-Chips, 2009

Using Bulk Built-In Current Sensors and recomputing techniques to mitigate transient faults in microprocessors.

Franco Leite, Tiago R. Balen, Marcos Hervé, Marcelo Lubaszewski, Gilson I. Wirth

Proceedings of the 10th Latin American Test Workshop, 2009

NoC interconnection functional testing: Using boundary-scan to reduce the overall testing time.

Marcos Barcellos Hervé, Érika F. Cota, Fernanda Lima Kastensmidt, Marcelo Lubaszewski

Proceedings of the 10th Latin American Test Workshop, 2009

Efficient Test Circuit to Qualify Logic Cells.

Renato P. Ribas, Simone Bavaresco, Marcelo Lubaszewski, André Inácio Reis

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2009), 2009

Improving yield of torus nocs through fault-diagnosis-and-repair of interconnect faults.

Caroline Concatto, Pedro Almeida, Fernanda Lima Kastensmidt, Érika F. Cota, Marcelo Lubaszewski, Marcos Hervé

Proceedings of the 15th IEEE International On-Line Testing Symposium (IOLTS 2009), 2009

Can Functional Test Achieve Low-cost Full Coverage of NoC Faults?

Marcelo Lubaszewski

Proceedings of the 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009

2008

Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop.

Bozena Kaminska, Marcelo Lubaszewski, José Machado da Silva

VLSI Design, 2008

A High-Fault-Coverage Approach for the Test of Data, Control and Handshake Interconnects in Mesh Networks-on-Chip.

Érika F. Cota, Fernanda Gusmão de Lima Kastensmidt, Maico Cassel, Marcos Hervé, Pedro Almeida, Paulo Meirelles, Alexandre M. Amory, Marcelo Lubaszewski

IEEE Trans. Computers, 2008

A novel AES cryptographic core highly resistant to differential power analysis attacks.

Felipe Ghellar, Marcelo Lubaszewski

Proceedings of the 21st Annual Symposium on Integrated Circuits and Systems Design, 2008

A fault-tolerant, DFA-resistant AES core.

Carlos Roberto Moratelli, Felipe Ghellar, Érika F. Cota, Marcelo Lubaszewski

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008

2007

Wrapper design for the reuse of a bus, network-on-chip, or other functional interconnect as test access mechanism.

Alexandre M. Amory, Kees Goossens, Erik Jan Marinissen, Marcelo Lubaszewski, Fernando Moraes

IET Comput. Digit. Tech., 2007

Guest Editorial.

Marcelo Lubaszewski, Andrew Richardson, C. C. Su

J. Electron. Test., 2007

Built-In Self-Test of Field Programmable Analog Arrays based on Transient Response Analysis.

Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell

J. Electron. Test., 2007

DfT for the Reuse of Networks-on-Chip as Test Access Mechanism.

Alexandre M. Amory, Frederico Ferlini, Marcelo Lubaszewski, Fernando Moraes

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

Redefining and testing interconnect faults in Mesh NoCs.

Érika F. Cota, Fernanda Lima Kastensmidt, Maico Cassel, Paulo Meirelles, Alexandre M. Amory, Marcelo Lubaszewski

Proceedings of the 2007 IEEE International Test Conference, 2007

Single Event Upset in SRAM-based Field Programmable Analog Arrays: Effects and Mitigation.

Tiago R. Balen, Fernanda Lima Kastensmidt, Marcelo Lubaszewski, Michel Renovell

Proceedings of the 2007 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2007), 2007

2006

Functional Test of Field Programmable Analog Arrays.

Tiago R. Balen, José Vicente Calvano, Marcelo Lubaszewski, Michel Renovell

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Improving ATPG Gate-Level Fault Coverage by using Test Vectors generated from Behavioral HDL Descriptions.

Margrit R. Krug, Marcelo Lubaszewski, Marcelo de Souza Moraes

Proceedings of the IFIP VLSI-SoC 2006, 2006

A cryptography core tolerant to DFA fault attacks.

Carlos Roberto Moratelli, Érika F. Cota, Marcelo Lubaszewski

Proceedings of the 19th Annual Symposium on Integrated Circuits and Systems Design, 2006

Using a software testing technique to identify registers for partial scan implementation.

Margrit R. Krug, Marcelo de Souza Moraes, Marcelo Lubaszewski

Proceedings of the 19th Annual Symposium on Integrated Circuits and Systems Design, 2006

Wrapper Design for the Reuse of Networks-on-Chip as Test Access Mechanism.

Alexandre M. Amory, Kees Goossens, Erik Jan Marinissen, Marcelo Lubaszewski, Fernando Moraes

Proceedings of the 11th European Test Symposium, 2006

2005

Built-in self-test of global interconnects of field programmable analog arrays.

Antonio Andrade Jr., Gustavo Vieira, Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell

Microelectron. J., 2005

Applying the Oscillation Test Strategy to FPAA's Configurable Analog Blocks.

Tiago R. Balen, Antonio Q. Andrade, Florence Azaïs, Marcelo Lubaszewski, Michel Renovell

J. Electron. Test., 2005

A Strategy for Optimal Test Point Insertion in Analog Cascaded Filters.

Florence Azaïs, Marcelo Lubaszewski, Pascal Nouet, Michel Renovell

J. Electron. Test., 2005

Testing the Interconnect Networks and I/O Resources of Field Programmable Analog Arrays.

Gustavo Pereira, Antonio Andrade Jr., Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

A constraint-based solution for on-line testing of processors embedded in real-time applications.

Marcelo de Souza Moraes, Érika F. Cota, Luigi Carro, Flávio Rech Wagner, Marcelo Lubaszewski

Proceedings of the 18th Annual Symposium on Integrated Circuits and Systems Design, 2005

A scalable test strategy for network-on-chip routers.

Alexandre M. Amory, Eduardo Wenzel Brião, Érika F. Cota, Marcelo Lubaszewski, Fernando Gehm Moraes

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Test Time Reduction Reusing Multiple Processors in a Network-on-Chip Based Architecture.

Alexandre M. Amory, Marcelo Lubaszewski, Fernando Gehm Moraes, Edson I. Moreno

Proceedings of the 2005 Design, 2005

2004

Reusing an on-chip network for the test of core-based systems.

Érika F. Cota, Luigi Carro, Marcelo Lubaszewski

ACM Trans. Design Autom. Electr. Syst., 2004

A New FPGA for DSP Applications Integrating BIST Capabilities.

Alex Gonsales, Marcelo Lubaszewski, Luigi Carro, Michel Renovell

J. Electron. Test., 2004

Searching for Global Test Costs Optimization in Core-Based Systems.

Érika F. Cota, Luigi Carro, Marcelo Lubaszewski, Alex Orailoglu

J. Electron. Test., 2004

An Approach to the Built-In Self-Test of Field Programmable Analog Arrays.

Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Marcelo Lubaszewski, Michel Renovell

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

Improving mixed-signal SOC testing: a power-aware reuse-based approach with analog BIST.

Antonio Andrade Jr., Érika F. Cota, Marcelo Lubaszewski

Proceedings of the 17th Annual Symposium on Integrated Circuits and Systems Design, 2004

Reducing test time with processor reuse in network-on-chip based systems.

Alexandre M. Amory, Érika F. Cota, Marcelo Lubaszewski, Fernando Gehm Moraes

Proceedings of the 17th Annual Symposium on Integrated Circuits and Systems Design, 2004

Testing the Configurable Analog Blocks of Field Programmable Analog Arrays.

Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Michel Renovell, Marcelo Lubaszewski

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Test and Design-for-Test of Mixed-Signal Integrated Circuits.

Marcelo Lubaszewski, José Luis Huertas

Proceedings of the Information Technology, Selected Tutorials, 2004

2003

The SigmaDelta-BIST Method Applied to Analog Filters.

L. Cassol, O. Betat, Luigi Carro, Marcelo Lubaszewski

J. Electron. Test., 2003

The Impact of NoC Reuse on the Testing of Core-based Systems.

Érika F. Cota, Márcio Eduardo Kreutz, Cesar A. Zeferino, Luigi Carro, Marcelo Lubaszewski, Altamiro Amadeu Susin

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

SIFU! - A Didactic Stuck-at Fault Simulator.

Vinícius P. Correia, Marcelo Lubaszewski, André Inácio Reis

Proceedings of the 2003 International Conference on Microelectronics Systems Education, 2003

Designing for Test Analog Signal Processors for MEMS-Based Inertial Sensors.

José Vicente Calvano, Marcelo Lubaszewski

Proceedings of the 3rd IEEE International Workshop on System-on-Chip for Real-Time Applications (IWSOC'03), 30 June, 2003

Power-aware NoC Reuse on the Testing of Core-based Systems.

Érika F. Cota, Luigi Carro, Flávio Rech Wagner, Marcelo Lubaszewski

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Filters Designed for Testability Wrapped on the Mixed-Signal Test Bus.

José Vicente Calvano, Vladimir Castro Alves, Antonio Carneiro de Mesquita Filho, Marcelo Lubaszewski

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Testability Properties of BDDs.

Felipe S. Marques, Vinícius P. Correia, A. Prado, Marcelo Lubaszewski, André Inácio Reis

Proceedings of the 15th Annual Symposium on Integrated Circuits and Systems Design, 2002

Generic and Detailed Search for TAM Definition in Core-Based Systems.

Érika F. Cota, Luigi Carro, Alex Orailoglu, Marcelo Lubaszewski

Proceedings of the 3rd Latin American Test Workshop, 2002

State Model Approach for Analog Fault Modeling.

José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Marcelo Lubaszewski, Vladimir Castro Alves

Proceedings of the 3rd Latin American Test Workshop, 2002

Designing for Test Butterworth and Chebyshev Low-Pass Filters of Any Order.

José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski, Antonio Carneiro de Mesquita Filho

Proceedings of the 3rd Latin American Test Workshop, 2002

Estimating Static Parameters of A-to-D Converters from Spectral Analysis.

Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell, Marcelo Lubaszewski

Proceedings of the 3rd Latin American Test Workshop, 2002

Test Planning and Design Space Exploration in a Core-Based Environment.

Érika F. Cota, Luigi Carro, Marcelo Lubaszewski, Alex Orailoglu

Proceedings of the 2002 Design, 2002

2001

Concepção de Circuitos e Sistemas Integrados.

Renato P. Ribas, André Inácio Reis, Marcelo Lubaszewski

RITA, 2001

Guest Editorial.

Marcelo Lubaszewski, Víctor H. Champac

J. Electron. Test., 2001

Synthesis of an 8051-Like Micro-Controller Tolerant to Transient Faults.

Érika F. Cota, Fernanda Lima, Sana Rezgui, Luigi Carro, Raoul Velazco, Marcelo Lubaszewski, Ricardo Reis

J. Electron. Test., 2001

Fault Models and Test Generation for OpAmp Circuits - The FFM.

José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski

J. Electron. Test., 2001

A BIST Procedure for Analog Mixers in Software Radio.

André C. Nácul, Luigi Carro, Daniel Janner, Marcelo Lubaszewski

Proceedings of the 14th Annual Symposium on Integrated Circuits and Systems Design, 2001

An Analog-based Approach for MEMS Testing.

Bernard Courtois, Salvador Mir, Benoît Charlot, Marcelo Lubaszewski

Proceedings of the 2nd Latin American Test Workshop, 2001

A Test Method for a Broad Class of DSP Circuits.

Érika F. Cota, Luigi Carro, Marcelo Lubaszewski

Proceedings of the 2nd Latin American Test Workshop, 2001

The Sigma-Delta-Bist Method Applied to Linear Analog Circuits.

L. Cassol, Luigi Carro, Marcelo Lubaszewski

Proceedings of the 2nd Latin American Test Workshop, 2001

Filter Sensitivity Analysis Using the TRAM.

José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski

Proceedings of the 2nd Latin American Test Workshop, 2001

Designing Testable Networks for Transfer Function Realization.

José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski, Antonio Carneiro de Mesquita Filho

Proceedings of the 2nd Latin American Test Workshop, 2001

Built-in Test of Analog Non-Linear Circuits in a SOC Environment.

Luigi Carro, André C. Nácul, Daniel Janner, Marcelo Lubaszewski

Proceedings of the SOC Design Methodologies, 2001

2000

Design of self-checking fully differential circuits and boards.

Marcelo Lubaszewski, Salvador Mir, Vladimir Kolarik, C. Nielsen, Bernard Courtois

IEEE Trans. Very Large Scale Integr. Syst., 2000

A new adaptive analog test and diagnosis system.

Érika F. Cota, Marcelo Negreiros, Luigi Carro, Marcelo Lubaszewski

IEEE Trans. Instrum. Meas., 2000

Fault Detection Methodology and BIST Method for 2nd Order Butterworth, Chebyshev and Bessel Filter Approximations.

José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski

Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

Testability Properties of Vertex Precedent BDDs.

André Inácio Reis, A. Prado, Marcelo Lubaszewski

Proceedings of the 13th Annual Symposium on Integrated Circuits and Systems Design, 2000

Designing a Radiation Hardened 8051-Like Micro-Controller.

Fernanda Gusmão de Lima, Érika F. Cota, Luigi Carro, Marcelo Lubaszewski, Ricardo Reis, Raoul Velazco, Sana Rezgui

Proceedings of the 13th Annual Symposium on Integrated Circuits and Systems Design, 2000

Fault Models and Compact Test Vectors for MOS OpAmp circuits.

José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski, Antonio Carneiro de Mesquita Filho

Proceedings of the 13th Annual Symposium on Integrated Circuits and Systems Design, 2000

A Self-Testing Mask Programmable Matrix Using Built-in Current Sensing.

Fernanda Gusmão de Lima, Eduardo D'Avila, Mauricio Moraes, Marcelo Lubaszewski, Ricardo Reis

Proceedings of the 1st Latin American Test Workshop, 2000

Implementing a Self-Checking PROFIBUS Slave.

Margrit Reni Krug, Marcelo Lubaszewski, José Manuel Martins Ferreira, Gustavo Ribeiro da Costa Alves

Proceedings of the 1st Latin American Test Workshop, 2000

Synthesis of a 8051-Like Microcontroller Tolerant to Transient Faults.

Érika F. Cota, Marcelo Lubaszewski, Raoul Velasco, Sana Rezgui

Proceedings of the 1st Latin American Test Workshop, 2000

On the Temperature Dependencies of Analog BIST.

Luigi Carro, Michel Renovell, Érika F. Cota, Marcelo Lubaszewski, Yves Bertrand, Florence Azaïs

Proceedings of the 1st Latin American Test Workshop, 2000

Using Reconfigurability Features to Break Down Test Costs: a Case Study.

Luigi Carro, Luciano Agostini, Roberto Pacheco, Marcelo Lubaszewski

Proceedings of the 1st Latin American Test Workshop, 2000

The Use of Macromodels on Op-Amp Circuits Fault Modeling.

José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski

Proceedings of the 1st Latin American Test Workshop, 2000

Mixed-Signal Test Bus IEEE 1149.4 Compatible BIST Scheme for Classical 2nd Order Filter Approximations using the Transient Response Analysis Method.

José Vicente Calvano, Vladimir Castro Alves, Marcelo Soares Lubaszewski

Proceedings of the 1st Latin American Test Workshop, 2000

Reuse of Existing Resources for Analog BIST of a Switch Capacitor Filte.

Érika F. Cota, Michel Renovell, Florence Azaïs, Yves Bertrand, Luigi Carro, Marcelo Lubaszewski

Proceedings of the 2000 Design, 2000

TI-BIST: a temperature independent analog BIST for switched-capacitor filters.

Luigi Carro, Érika F. Cota, Marcelo Lubaszewski, Yves Bertrand, Florence Azaïs, Michel Renovell

Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000

Testing a PWM circuit using functional fault models and compact test vectors for operational amplifiers.

José Vicente Calvano, Vladimir Castro Alves, Marcelo Lubaszewski

Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000

1999

Design and Test of MEMs.

Bernard Courtois, Jean-Michel Karam, Salvador Mir, Marcelo Lubaszewski, Vladimír Székely, Márta Rencz, Klaus Hofmann, Manfred Glesner

Proceedings of the 12th International Conference on VLSI Design (VLSI Design 1999), 1999

Fault modeling of suspended thermal MEMS.

Benoît Charlot, Salvador Mir, Érika F. Cota, Marcelo Lubaszewski, Bernard Courtois

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

A Method to Diagnose Faults in Linear Analog Circuits using an Adaptive Tester.

Érika F. Cota, Luigi Carro, Marcelo Lubaszewski

Proceedings of the 1999 Design, 1999

1998

A Reliable Fail-Safe System.

Marcelo Lubaszewski, Bernard Courtois

IEEE Trans. Computers, 1998

Thermal Monitoring of Self-Checking Systems.

Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois

J. Electron. Test., 1998

Testing MEMS.

Jean-Michel Karam, Marcelo Lubaszewski, R. D. Shawn Blanton, Andrew Richardson

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

Microsystems Testing: an Approach and Open Problems.

Marcelo Lubaszewski, Érika F. Cota, Bernard Courtois

Proceedings of the 1998 Design, 1998

An Approach to the On-Line Testing of Operational Amplifiers.

Jaime Velasco-Medina, Marcelo Lubaszewski, Michael Nicolaidis

Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998

Bridging the Gap between Microelectronics and Micromechanics Testing.

Marcelo Lubaszewski

Proceedings of the 7th Asian Test Symposium (ATS '98), 2-4 December 1998, Singapore, 1998

1997

A CAT Tool for Frequency-domain Testing and Diagnosis on Analog.

Érika F. Cota, José Di Elias Domênico, Marcelo Lubaszewski

J. Braz. Comput. Soc., 1997

1996

Unified built-in self-test for fully differential analog circuits.

Salvador Mir, Marcelo Lubaszewski, Bernard Courtois

J. Electron. Test., 1996

Fault-based ATPG for linear analog circuits with minimal size multifrequency test sets.

Salvador Mir, Marcelo Lubaszewski, Bernard Courtois

J. Electron. Test., 1996

Design of high-performance band-pass sigma-delta modulator with concurrent error detection.

Fabrizio Francesconi, Valentino Liberali, Marcelo Lubaszewski, Salvador Mir

Proceedings of Third International Conference on Electronics, Circuits, and Systems, 1996

ABILBO: Analog BuILt-in Block Observer.

Marcelo Lubaszewski, Salvador Mir, Leandro Pulz

Proceedings of the 1996 IEEE/ACM International Conference on Computer-Aided Design, 1996

Automatic Test Generation for Maximal Diagnosis of Linear Analogue Circuits.

Salvador Mir, Bernard Courtois, Marcelo Lubaszewski, Vladimir Kolarik

Proceedings of the 1996 European Design and Test Conference, 1996

Thermal Monitoring Of Safety-Critical Integrated Systems.

Vladimír Székely, Márta Rencz, Jean-Michel Karam, Marcelo Lubaszewski, Bernard Courtois

Proceedings of the 5th Asian Test Symposium (ATS '96), 1996

1995

Analog checkers with absolute and relative tolerances.

Vladimir Kolarik, Salvador Mir, Marcelo Lubaszewski, Bernard Courtois

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995

Frequency-based BIST for analog circuit testin.

Khaled Saab, Bozena Kaminska, Bernard Courtois, Marcelo Lubaszewski

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

Mixed-signal circuits and boards for high safety applications.

Marcelo Lubaszewski, Vladimir Kolarik, Salvador Mir, C. Nielsen, Bernard Courtois

Proceedings of the 1995 European Design and Test Conference, 1995

1994

Designing self-exercising analogue checkers.

Vladimir Kolarik, Marcelo Lubaszewski, Bernard Courtois

Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

Built-in self-test and fault diagnosis of fully differential analogue circuits.

Salvador Mir, Vladimir Kolarik, Marcelo Lubaszewski, C. Nielsen, Bernard Courtois

Proceedings of the 1994 IEEE/ACM International Conference on Computer-Aided Design, 1994

1993

Unifying test and diagnosis of interconnects and logic clusters in partial boundary scan boards.

Meryem Marzouki, Marcelo Lubaszewski, Mohamed Hedi Touati

Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993

1992

On the Design of Self-Checking Boundary Scannable Boards.

Marcelo Lubaszewski, Bernard Courtois

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992