Masayasu Ishiko

According to our database, Masayasu Ishiko authored at least 4 papers between 2002 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2006

Design concept for wire-bonding reliability improvement by optimizing position in power devices.

Masayasu Ishiko, Masanori Usui, Takashi Ohuchi, Mikio Shirai

Microelectron. J., 2006

2005

Effects of uni-axial mechanical stress on IGBT characteristics.

Masanori Usui, Masayasu Ishiko, Koji Hotta, Satoshi Kuwano, Masato Hashimoto

Microelectron. Reliab., 2005

2004

Investigation of IGBT turn-on failure under high applied voltage operation.

Masayasu Ishiko, Koji Hotta, Sachiko Kawaji, Takahide Sugiyama, Tomoyuki Shouji, Takeshi Fukami, Kimimori Hamada

Microelectron. Reliab., 2004

2002

Characterization of Trench MOS Gate Structures Utilizing Photon Emission Microscopy.

Masanori Usui, Takahide Sugiyama, Masayasu Ishiko, Jun Morimoto, Hirokazu Saitoh, Masaki Ajioka

Microelectron. Reliab., 2002